摘要
详细描述了原子力显微镜(AFM)的基本工作原理,利用原子力显微镜测试苹果果皮样品在不同时 间段的超微结构,分析其粗糙度的变化,并对AFM在果皮结构分析的前景进行了展望。
The operating principle of atomic force microscope (AFM) was summarized in this paper. The microstructural features of apple surface after a period of time for separating were investigated using AFM. It was found that the surface roughness parameters were changed due to the staying for different period of time.
出处
《华中农业大学学报》
CAS
CSCD
北大核心
2005年第S1期91-93,共3页
Journal of Huazhong Agricultural University
关键词
苹果果皮
原子力显微镜
超微结构
apple surface
atomic force microscope （AFM）
microstructure
