摘要
采用低压聚乙烯镶边垫底的粉末样品压片制样,用PW2440X射线荧光光谱仪对多目标地球化学调查样品中Na2O、MgO、Al2O3、SiO2、P、K2O、CaO、Ti、Mn、Fe2O3、Co、Nb、Zr、Y、Sr、Rb、Pb、Th、Zn、Cu、Ni、V、Cr、Ba、La等组分进行测定。重点讨论了微量元素的背景选择和谱线重叠校正问题。使用经验系数法和康普顿散射线作内标校正基体效应,经标准物质分析检验,结果与标准值吻合,用GBW07308和GBW07310水系沉积物国家一级标准物质作精密度试验,统计结果RSD(n=12)除La、Cr、Co和Th<14.00%以外,其余各组分均小于6.00%。
A method for direct determination of Na_(2)O, MgO, Al_(2)O_(3), SiO_(2), P, K_(2)O, CaO, Ti, V, Cr, Mn,( Fe_2O_3,) Co, Ni, Cu, Pb, Zn, Nb, Zr, Y, Sr, Rb, Th, Ba and La in geochemical exploration samples by XRF with sample preparation of pressed powder pellets was developed. The interference from background and spectra overlap was discussed. The matrix effect was corrected by experience coefficients and using scattered radiation as internal standard (for trace elements). The accuracy of the method was evaluated by analysis of certified reference materials of GBW 07301a, GBW 07317 and GBW 07423. The results are in agreement with certified values with precision of less than 6.0% RSD (n=12) expect for La, Cr, Co and Th (RSD<14.00%).
出处
《岩矿测试》
CAS
CSCD
北大核心
2004年第1期19-24,共6页
Rock and Mineral Analysis
基金
国土资源部地质大调查项目(DKD9904017)
关键词
化探样品
X射线荧光光谱仪
背景位置选择
谱线重叠校正
粉末样品压片
geochemical exploration sample
PW2440 X-ray fluorescence spectrometer
selected background position
spectra overlap correction
pressed powder pellet
