摘要
通过化学成分、熔融温度范围测定 ,利用偏光、反光显微镜及扫描电镜、 X衍射仪等对产品釉缺陷进行了分析 ;指出了产生缺陷的原因 。
By means of chemical analysis,determination of melting temperature rang,polarizing micoscope,reflecting micoscope,scanning electron microscope and X ray, studies the factors concerned, Which result in glaze defect, and proposes some suggestions relevant practical process
出处
《电瓷避雷器》
CAS
北大核心
2000年第2期16-20,共5页
Insulators and Surge Arresters
关键词
釉
釉缺陷
显微结构
glaze
glaze defect
microstructure
