摘要
自行设计了电弧腐蚀速率的测量方法,避免了一般电弧腐蚀速率测量中存在的不足,并对真空断路器中常用的 CuCr25,CuCr50 触头材料以及纯 Cu 和纯 Cr 的电弧腐蚀速率进行了测量。研究结果表明, 纯 Cu,CuCr25,CuCr50和纯 Cr 的电弧腐蚀速率分别为 52.9 μg/C,33.2 μg/C,31μg/C 和 25.9 μg/C。CuCr25 和 CuCr50 的电弧腐蚀速率相差不大,都较纯 Cu 有大幅度的降低,而与纯 Cr 的电弧腐蚀速率比较接近。此外,用 SEM 对 4 种触头材料经 100 次燃弧之后的电极表面进行了现测,清楚地反映了经电弧腐蚀之后触角材料的表面特征。
A new method was designed for the measurement of arc erosion rates of contact materials in this paper. Arc erosion rates were measured for CuCr25, CuCr50 contact materials by the method designed, as well as for pure Cu, Cr metal. Erosion rates of pure Cu, CuCr25 CuCr50 and pure Cr are 52.9 mug/C, 33.2 mug/C, 31 mug/C and 25.9 mug/C, respectively. The results indicate that arc erosion rates of CuCr25 and CuCr50 are almost same, which are much lower than that of Cu and slightly higher than that of Cr. in addition, the observations on the were made by SEM surface molten layer of electrode of the four contact materials after 100-time breakdowns Their surface characteristic after arc erosion.
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
北大核心
2005年第2期295-298,共4页
Rare Metal Materials and Engineering
基金
国家"863"计划引导项目资助(2003AA001047)
国家自然科学基金资助(50071043)
