摘要
高纯超细钛酸钡中硅的存在会导致钛酸钡某些性能的下降,限制了其应用领域。用石墨炉原子吸收光谱法研究钛酸钡中痕量硅的测定,在高纯钛酸钡新领域的研究及生产中都有重要的现实意义。用氢氟酸高压密封溶解样品,石墨炉原子吸收光谱法测定高纯钛酸钡中痕量硅,干扰少,测定结果准确,相对标准偏差小于 6%。
The silicon existed in the high-purity barium titanate will result in some performance of barium titanate decrease,so as to limit its application.The determination of trace silicon in high-purity barium titanate by GFAAS method is studied,in which the sample is dissolved in hydrofluoric acid with high pressure seal.This method has the features of low interference,high accuracy and relative standard error less than 6%.
出处
《无机盐工业》
CAS
北大核心
2005年第3期50-51,共2页
Inorganic Chemicals Industry
