摘要
本文提出了高纯氯化钠中痕量杂质测定的FIA—ICP—AES新方法。对FIA和ICP工作参数进行了合理选择,对基体效应和酸效应及其影响因素进行了讨论。在最佳工作条件下,方法的检出限为0.033—7.6μg/mL,相对标准偏差为0.58—2.9%(n=10)。结果表明,本法具有快速、灵敦、精密度好和操作简单的特点。
A method for the determination of trace elemnts in high purity sodium chloride by using FIA-ICP-AES technique has been developed. Several factors including volume of introduciong volume of introduction sample, exposure time, matrix effect, acid effect, and ICP working conditions were investigated. Under optimum experimental conditions, the detection limits for the analyte are 0.033 to 7.6 μg/mL; the relative standard deviations are in the range of 0.58--2.9%(n=10), and the recoveries of the method are higher than 90%. The method proposed has the advantages of analytical efficiency, simplicity. sensitvity and accuracy for the determination of trace amounts of impurities in high purity sodium chloride.
出处
《武汉大学学报（自然科学版）》
CSCD
1989年第4期85-90,共6页
Journal of Wuhan University(Natural Science Edition)
关键词
氯化钠
痕量元素
流动注射分析
flour injection analysis
inductiwely coupled plasma
high purity sodium chlornide
