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NIM用计算电容测定的量子化霍尔电阻的SI值 被引量:3

A Determination of the SI Value of QHR by the Cross-capacitor in NIM
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摘要 量子化霍尔电阻的SI值的准确测定对进一步改进冯·克里青常数的准确度及国际基本物理常数平差均有重要意义。中国计量科学研究院于1994年春用计算电容测定了量子化霍尔电阻的SI值,测得i=1时的量子化霍尔电阻的SI值为RH=25812.8084(34)Ω,其不确定度为1.3×10-7(1σ)。 The determination of the SI value of the Quantized Hall Resistance (QHR) is very important for further improvement of the accuracy of von Klitzing constant and the international adjustment of fundamental physical constants.The determination of the SI value of QHR by the cross-capacitor was completed in NIM in the spring of 1994. The SI value of QHR (i=1) was found to be RH = 25812. 8084(34)Ω with an uncertainty of 0.13ppm (1σ).
出处 《计量学报》 CSCD 1995年第1期1-5,共5页 Acta Metrologica Sinica
关键词 量子化霍尔电阻 计算电容 SI值 霍尔电阻 Quantized Hall resistance Cross-capacitor von Klitzing constant
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参考文献5

  • 1张钟华,Acta Metrol Sin,1993年,14卷,81页
  • 2Zhang Zhonghu,1992年
  • 3张钟华,IEEE Trans IM,1991年,40卷,889页
  • 4张钟华,1988年
  • 5张钟华,Acta Metrol Sin,1985年,6卷,33页

同被引文献46

  • 1郭奕玲.基本物理常数评定的新进展[J].物理,1989,18(3):129-135. 被引量:2
  • 2陆文骏.我国的国家电感基准[J].现代计量测试,1995,3(3):41-44. 被引量:3
  • 3纪亮.计量科技被纳入国家中长期科技发展纲要[J].中国计量,2006(3):9-9. 被引量:3
  • 4陆文骏.NIM的国家电感工作基准[J].计量学报,1996,17(1):6-11. 被引量:2
  • 5Thompson A M, Lampard D G. A New Theorem in Electrostatics and Its Application to Calculable Standards of Capacitance[J]. Nature, 1956,177(4515) : 888.
  • 6Thompson A M. The precise measurement of small capacitance [ J ]. IEEE Transactions on Instrumentation and Measurement, 1983,32 : 47 - 50.
  • 7Cutkosky R D. Evaluation of NBS unit of resistance based on a computable capacitor[ J]. Journal of Research of the National Bureau of Standards, 1961, 65 A: 147- 158.
  • 8Cutkosky R A. Four Terminal Pair Networks as Precision Admittance and Impedance Standards [ ] ]. IEEE Transactions on Communication and Electronics, 1964, (70) : 19 -22.
  • 9Vonklitzing K, Ebert G. Application of the Quantum Hall-Effect in Metrology[ J]. Metrologia, 1985,21 (1): 11 -18.
  • 10Vonklitzing K, Dorda G, Pepper M. New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance [ J ]. Physical Review Letters, 1980,45 (6) : 494 - 497.

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