摘要
本文研究激光辐照光伏型梯化铟探测器的损伤机制，指出激光的损伤使局部ｐｎ结退化为电阻，对器件性能的影响等效于并联一个电阻，用来解释实验中的各种现象，理论与实验曲线符合得很好。该模型也可以解释闪光效应，即光照对此种器件的修复作用。
The damage mechanisms of InSb detectors (PV),which are irradiated by laosers, are investigated. It is pointed out that the laser damages degrade the p-n junction locally,which has the similar effects as a parallel resistance upon the performances of the devices. Various experimental phenomena are explained. The calculeted values fit the experimental data well. This model is also able to explain the 'flash' effects,i. e. InSb (PV) detectors may have better performances after they are irradiated by intense light.
出处
《应用激光》
CSCD
北大核心
1995年第1期17-19,共3页
Applied Laser
基金
国家高技术计划激光技术领域资助
