期刊文献+

BiFeO_3薄膜中的电学输运性质(英文) 被引量:4

ELECTRICAL TRANSPORT PROPERTIES OF BiFeO_3 THIN FILM
在线阅读 下载PDF
导出
摘要 报道了铁酸铋薄膜样品在80K^300K温度范围直流电学输运性质的研究结果.利用同一前驱体不同老化时间,用化学溶液沉积法在钛酸锶衬底上制备出两种样品.在低阻样品中,低场下电流随电压变化遵从欧姆定律,电阻不随温度变化;而在中等强度外场下显示出肖特基二极管性质.在高阻样品中,低场下电流密度沿晶界分布,输运中的势垒能级为0.57eV;高场下电流的传输则遵从Frenkel-Poole模型,相关势垒能级0.12eV.低阻和高阻两种样品在85K温度下可测最大剩余极化分别为2.6μC/cm2和28.8μC/cm2. DC electrical transport properties of perovskite BiFeO3 thin films were studied in the temperature range from 80K to 300K. The films with high or low resistance on SrTiO3 substrates were prepared by a chemical solution deposition method from the same precursor solution at different aged time. For the low resistance samples, the voltage dependence of current is ohmic and temperature independent at low electric fields. At a medium strength of electric field, it behaves like a typical Schottky diode. For the high resistance samples it is found that electric carriers move along the grain boundaries of the films with an activation energy of 0. 57eV at low electric field while the conduction mechanism can be described with the Frenkel- Poole model with an energy barrier of 0. 12eV at higher electric fields, The measurable maximum values of remnant polarization are 2. 6 μC/cm^2 and 28.8μC/cm^2 at the temperature of 85 K for the two kinds of samples, respectively.
出处 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2006年第6期401-404,共4页 Journal of Infrared and Millimeter Waves
基金 the National Natural Science Foundation of China(60371040)and The Foundation of Science and Technology Commis-sion of Shanghai Municipality(03JC14076)
关键词 铁电铁磁薄膜 电学输运 铁酸铋薄膜 biferroic film electrical transportation bismuth ferrate film
  • 相关文献

参考文献13

  • 1Wang J,Neaton B,Zhang H,et al.Epitaxial BiFeO3 multiferroic thin film heterostructures[J].Science,2003,299:1719-1722.
  • 2Yun K Y,Noda M,Okuyama M.Prominent ferroelectricity of BiFeO3 thin films prepared by pulsed-laser deposition[J].Appl.Phys.Lett.,2003,83:3981-3983.
  • 3Neaton J B,Ederer C,Waghmare U V,et al.First-principles study of the spontaneous polarization in multiferroic BiFeO3[J].Phys.Rev.B.,2005,71:014113.
  • 4Yi-Hsien Lee,Jenn-Ming Wu,Yu-Lun Chueh,et al.Lowtemperature growth and interface characterization of BiFeO3 thin films with reduced leakage current[J].Appl.Phys.Left.,2005,87:172901.
  • 5Iakovlev S,Solterbeck C H,Kuhnke M,et al.Multiferroic BiFeO3 thin films processed via chemical solution deposition:Structural and electrical characterization[J].J.Appl.Phys.,2005,97:094901.
  • 6李亚巍,孟祥建,于剑,王根水,孙璟兰,褚君浩,张伟风.化学溶液分解法制备LaNiO_3薄膜的研究[J].红外与毫米波学报,2003,22(4):269-272. 被引量:7
  • 7Li Y W,Sun J L,Chen J,et al.Preparation and characterization of BiFeO3 thin.Films grown on LaNiO3-coated SrTiO3 substrate by chemical solution deposition[J].J.Crys.Growth,2005,285:595-599.
  • 8Creswell R A,Perlman M M.Thermal currents from corona charged Mylar[J].J.Appl.Phys.,1970,41:2365-2375.
  • 9Iguchi E,Ueda K,and Jung W H.Conduction in LaCoO3 by small-polaron hopping below room temperature[J].Phys.Rev.,1996,B54:17431-17437.
  • 10Houze F,Meyer R,Schneegans O,et al.Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes[J].Appl.Phys.Lett.,1996,69:1975-1977.

二级参考文献9

  • 1[1]Hong J W, Jo W, Kim D C, et al. Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt/and on LaNiO3. Appl. Phys. Lett., 1999, 75: 3183-3185
  • 2[2]Ramesh R, Glichrist H, Sands T, et al. Ferroelectric La-Sr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon via template growth.Appl. Phys. Lett., 1993, 63: 3592-3594
  • 3[3]Tseng T F, Liu K S, Wu T B. Effect of LaNiO3/Pt double layers on the characteristics of (PbxLa1-x)(ZryTi1-y)O3 thin films.Appl. Phys. Lett., 1996, 68: 2505-2507
  • 4[4]Satyalakshmi K M, Mallya R M. Epitaxial metallic LaNiO3 thin films grown by pulsed laser deposition.Appl. Phys. Lett., 1993, 62: 1233-1235
  • 5[5]Li Aidong, Ge ChuanZhen, Lü Peng. Preparation of perovskite conductive LaNiO3 films by metalorganic decomposition. Appl. Phys. Lett., 1996, 68: 1347-1349
  • 6[6]Sánchez F,Ferrater C, Guerrero C, et al. High-quality epitaxial LaNiO3 thin films on SrTiO3(100) and LaAlO3(100).Appl. Phys. A., 2000, 71: 59-64
  • 7[7]Sánchez R D, Causa M T, Caneiro A, et al. Metal-insulator transition in oxygen-deficient LaNiO3-x perovskites. Phys. Rev., 1996, B54: 16574-16578
  • 8[8]Meng X J, Cheng J G, Li B, et al. Preparation and properties of highly (111) oriented PZT thin films by a modified sol-gel technique. J. Cryst. Growth, 2000, 208: 541-544
  • 9[9]Meng X J, Sun J L, Ye H J, et al. Preparation of highly (100)oriented metallic LaNiO3 films on Si substrates by a modified metalorganic decomposition technique.Applied Surface Science, 2001, 171: 68-73

共引文献6

同被引文献43

  • 1杨平雄,孟祥建,黄志明,禇君浩.层状钙钛矿铁电薄膜中铁电极化子研究(英文)[J].红外与毫米波学报,2005,24(1):1-6. 被引量:6
  • 2宋国利,孙凯霞.纳米ZnO薄膜可见发射机制研究[J].光子学报,2006,35(3):389-393. 被引量:20
  • 3谢吉民,徐洁明,朱建军.气相纳米SiO_2·nH_2O粒径控制与形貌研究[J].非金属矿,2006,29(3):22-24. 被引量:2
  • 4胡古今,洪学鹍,陈静,褚君浩,戴宁.高反射率周期性铁电多层膜形成机理研究[J].红外与毫米波学报,2007,26(2):89-91. 被引量:6
  • 5Hench L L. Bioceramics [J]. J. Amer. Ceram. Soc., 1998,81 (7) : 1705 - 1728.
  • 6Srinivas A, Kim D W, Hong K S. Observation of ferroelec- tromagnetic nature in rare-earth-substituted bismuth iron ti- tanate[J]. Appl. Phys. Lett. ,2003,83:2217-2219.
  • 7Wang J,Neaton J B,Zheng H,et al. Epitaxial BiFeO3 muhi- ferroic thin film heterostrueturcs [ J ]. Science, 2003,299 : 1719 - 1722.
  • 8Lee Y H,Wu J M, Chueh W L, et al. Low temperature growth and interface characterization of BiFeO3 thin films with reduced leakage current[ J]. Appl. Phys. Lett. ,2005, 87 : 172901 - 172903.
  • 9Lee Y H,Wu J M,Lai C H. Influence of La doping in multi- ferroie properties of BiFeO3 thin films [ J ]. Appl. Phys. Lett. ,2006,88:042903 - 042905.
  • 10Wang Y, Nan C W. Enhanced ferroeleetrieity in Ti--doped multiferroie BiFeO3 thin films [ J ]. Appl. Phys. Lett., 2006,89:052903 - 052905.

引证文献4

二级引证文献12

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部