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HgCdTe晶体双晶衍射测量讨论 被引量:1

DOUBLE-CRYSTAL DIFFRACTION MEASUREMENT FOR HgCdTe CRYSTAL
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摘要 体晶和外延生长技术的进步明显改善了HgCdTe晶体的结构完整性,更多地提出了可定量评价其结晶品质的双晶衍射测量的需求。文中先用动力学衍射理论计算了完整HgCdTe及四种相关晶体X射线全反射角宽度,然后根据计算和实验结果讨论了适合于HgCdTe晶体双晶衍射测量的几何布置和测量条件对实际摆动曲线的影响。 The perfectness of HgCdTe crystal has been greatly improved for the obvious development of epitaxial growth technology, therefore, double-crystal diffraction measurement is required for evaluating crystal quality quantitatively. It is in this paper the angles of X-ray total reflection of perfect HgCdTe crystal and four kinds of relative crystals are calculated upon dynamic diffraction theory. The calculation data is analyzed with the experiment result for determining the reasonable geometrical arrangement of double crystal diffraction measurement for HgCdTe crystal in consideration of the influence of the measurement condition on actual vibration curves.
作者 蔡毅
机构地区 昆明物理研究所
出处 《红外与激光工程》 EI CSCD 1997年第2期18-26,44,共10页 Infrared and Laser Engineering
关键词 HGCDTE X射线衍射分析 X射线晶体学 外延生长 Mercury cadmium telluride X-ray diffraction analysis X-ray crystallography
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