期刊文献+

Effect of Density and Surface Roughness on Optical Properties of Silicon Carbide Optical Components 被引量:2

Effect of Density and Surface Roughness on Optical Properties of Silicon Carbide Optical Components
在线阅读 下载PDF
导出
摘要 The effect of density and surface roughness on the optical properties of silicon carbide optical components is investigated. The density is the major factor of the total reflectance while the surface roughness is the major factor of the diffuse reflectance. The specular reflectance of silicon carbide optical components can be improved by increasing the density and decreasing the surface roughness, in the form of reducing bulk absorption and surface-related scattering, respectively. The contribution of the surface roughness to the specular reflectance is much greater than that of the density. When the rms surface roughness decreases to 2.228nm, the specular reflectance decreases to less than 0. 7% accordingly. The effect of density and surface roughness on the optical properties of silicon carbide optical components is investigated. The density is the major factor of the total reflectance while the surface roughness is the major factor of the diffuse reflectance. The specular reflectance of silicon carbide optical components can be improved by increasing the density and decreasing the surface roughness, in the form of reducing bulk absorption and surface-related scattering, respectively. The contribution of the surface roughness to the specular reflectance is much greater than that of the density. When the rms surface roughness decreases to 2.228nm, the specular reflectance decreases to less than 0. 7% accordingly.
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2008年第3期1135-1137,共3页 中国物理快报(英文版)
关键词 supernova explosion proto-neutron star shock wave supernova explosion, proto-neutron star, shock wave
  • 相关文献

参考文献10

  • 1Khounsary A, Fernandez P, Assoufid L and Schwartz J 2002 Rev. Sci. Instrum. 73 1537
  • 2Johnson J S, Grobsky K and Bray D J 2002 Proc. SPIE. 4771 243
  • 3Ebizuka N, Dai Y, Eto H, Handa T, Takami H and Takahashi Y 2003 Proc. SPIE. 842 329
  • 4Zhang Y M, Zhang J H, Han J C, He X D and Yao W 2004 Mater. Lett. 58 1024
  • 5Bruggemann R, Reinig P and Holling M 2003 Thin Solid Films 427 358
  • 6Dericioglu A F and Kagawa Y 2003 J. Eur. Ceram. Soc. 23 951
  • 7Lai F C, Li M, Wang H Q, Hu H L, Wang X P, Hou J G, Song Y Z and Jiang Y S 2005 Thin Solid Films 448 314
  • 8Guinneton F, Valmalette J C and Gavarri J R 2000 Opt. Mater. 15 111
  • 9Guinneton F, Sauques L, Valmalette J C, Cros F and Gavarri J R 2005 J. Phys. Chem. Solids 66 63
  • 10Koo W H, Lee S J, Lee S M, Jeong S M, Choi S H and Baik H K 2004 J. Vac. Sci. Technol. A 22 2048

同被引文献13

引证文献2

二级引证文献7

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部