摘要
为拓展半导体激光器的应用,开展了半导体激光器对可见光CCD传感器的干扰实验研究,得出CCD饱和像素个数与激光输出功率和CCD传感器电子快门时间的对应关系。当电子快门时间分别为t=1/10000s、t=1/4000s和t=1/2000s时,CCD的饱和阈值分别为1W、1W和2.8W。"软损伤"的阈值为10W,然而,在激光输出最大功率为22.4W的条件下并没有使CCD损伤。
In order to explore more applications of laser diode （LD）, some experiments on visible CCD sensor countermeasure were deployed. The relationship between the number of statured pixels of CCD sensor and the power of LD, the electronic shutter speed was obtained. The threshold of saturation was 1 W,1 W and 2.8 W,corresponding the electronic shutter time t=1/10 000 s,1/4 000 s and 1/2 000 s.Ahhough the ＂soft damage＂ threshold was 10 W, there was no mechanical damage to CCD sensor when laser was set on the maximum output 22.4 W.
出处
《光机电信息》
2008年第12期26-29,共4页
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