摘要
样品经盐酸（1＋1）和硝酸（1＋1）分解后，采用电感耦合等离子体原子发射光谱法（ICP—AES）测定三氧化二钒和五氧化二钒中钾、钠、磷、硫、铁杂质元素的含量。采用基体匹配消除主量元素钒对杂质元素的干扰，优化了测定工作条件，确定钾、钠、磷、硫、铁的分析谱线分别为766．490nm、589．592nm、178．284nm、182．034nm、259．940nm。测定氧化钾、氧化钠、磷、硫、铁的检出限分别为0．020mg／L、0．012mg／L、0．008mg／L、0.010mg／L、0．002mg／L。方法用于标准样品和实际样品的分析，测定结果分别同认定值及其他方法的测定结果相吻合，相对标准偏差（n=11）为0．54％～4．0％。
The samples were dissolved in hydrochloric acid（1＋1） and nitric acid（1＋1）. The impure elements in vanadium trioxide and vanadium pentoxide including potassium, sodium, phosphorus, sulfur and iron were determined by inductively coupled plasma atomic emission spectrometry （ICP-AES）. The effects of vanadium could be eliminated by matrix matching. The working conditions were optimized. The analytical line were determined：K 766. 490 nm;Na,589. 592 nm;P,178. 284 nm;S,182. 034 nm;Fe,259. 940 nm. The determination results of standard samples and actual samples were in good agreement with the certified values and those obtained by other methods. The relative standard deviation（n=11） was 0.54%-4.0%.
出处
《冶金分析》
CAS
CSCD
北大核心
2010年第3期30-33,共4页
Metallurgical Analysis
关键词
电感耦合等离子体原子发射光谱法
氧化钒
钾
钠
磷
硫
铁
inductively coupled plasma atomic emission spectrometry
vanadium oxide
potassium
sodium
phosphorus
sulfur
iron
