摘要
对GH4169合金电子束焊接接头进行了裂纹尖端张开位移(CTOD)试验分析,试验温度为20℃和650℃,评价GH4169合金接头的抗断裂性能.在CTOD试验的基础上,开展GH4169合金电子束焊接接头裂纹容限评定.试验结果表明,不论是在常温下(20℃)还是在高温下(650℃),母材的CTOD值高于其焊缝值,即母材的抗断裂能力优于焊缝值,并且焊缝的CTOD值较低,易发生脆性断裂.裂纹容限的计算结果表明,在同一应力水平下,母材的裂纹容限比焊缝值高,但母材与焊缝的裂纹容限差值随着应力水平的升高而减小.
The GH4169 alloy joints were obtained in electron beam（EB）welding,and the fracture toughness tests of the joints were carried out on the crack tip opening displacement（CTOD）both at the temperature of 20 ℃ and 650 ℃.Based on the CTOD test,crack tolerance of EB-joints was studied.The results show that no matter what temperature it is,normal（20 ℃）or high（650 ℃）temperature,the average CTOD value of the materials is higher than that of the joints,and the average CTOD value of the joints is low,easy to be fractured.The result of calculating the crack tolerance shows that under the same stress level,the crack tolerance of the metal is higher than that of the joint,and when the stress level increases,the difference decreases.
出处
《焊接学报》
EI
CAS
CSCD
北大核心
2010年第4期38-40,共3页
Transactions of The China Welding Institution
