摘要
本文概括Ｘ射线衍射（ＸＲＤ）方法，拉曼散射谱（ＲａｍａｎＳｐｅｃｔｒａ）和电子显微术等方法，结合我们的工作实践，探讨氢氧化镍电极材料的微结构特性及其分析方法．Ｘ射线衍射和拉曼谱可以有效地用于预测氢氧化镍的电化学效率，而由Ｘ射线衍射测量确定的微晶结构参数，可以用于建立氢氧化镍正极活性材的利用率与这些微结构之间的关系．
The analytical techniques on the microsturcture characteristics of nickel hydroxide in Ni/MH batterieswere studied by using X-ray diffraction technique, Raman spectroscopy and electronmicroscopy. It is shownthat both X-ray diffraction technique and Raman spectroscopy can be used to predict effectively theelectrochemical efficiency of Ni(OH)2. The utilization of the nickel hydroxide active mass could be correlated with the crystalline parameters of microcrystals through those parameters determined by powder measurements, i. e. the smaller crystal size, the larger C-lattice constant, and the lower crystallinity lead tothe higher utilization ratio in general.
出处
《有色金属》
CSCD
1999年第3期79-82,共4页
Nonferrous Metals
基金
国家自然科学基金
关键词
氢氧化镍
微晶
微结构参数
电极材料
nickel hydroxide
microcrystal parameters
X-ray diffraction
Raman spectroscopy
electron microscopy
cycle life
