摘要
提出了一种可用于制作高反射率纯幅度取样光纤光栅的拼接技术方案,并对拼接误差和拼接次数对取样光栅光谱特性的影响进行了详细的理论分析和研究。理论分析结果表明,采用拼接技术可以获得良好的多波长取样光纤光栅反射谱,拼接误差对取样光栅反射谱的影响主要取决于拼接次数。在拼接三次时,可接受的拼接误差仅为±0.1μm;但在只拼接一次的情况下,拼接误差达±5μm时仍可获得良好的多波长反射谱。
A splicing technology,which can be used to fabricate high-reflectivity amplitude sampled gratings,is presented in this paper.The influence of the splicing errors and the splicing times on the reflectivity spectrum performance of rectangle-sampled gratings is analyzed.The research results show that the allowed splicing error is determined by the splicing times.The splicing error is preferably within（-0.1,0.1）μm with applying splicing technology for three times.However,if the splicing technology is applied for only once,a better multi-wavelength reflectance spectrum can be obained when the splicing error is within（-5,5）μm
出处
《半导体光电》
CAS
CSCD
北大核心
2011年第1期64-68,共5页
Semiconductor Optoelectronics
基金
国家自然科学基金项目(60777013)
北京市自然科学基金项目(4082023)
关键词
取样光栅
高反射率
拼接
拼接误差
拼接次数
sampled gratings
high reflectivity
splicing
splicing error
splicing times
