摘要
目的观察过氧化氢(H2O2)诱导SH-SY5Y细胞损伤后对线粒体膜电位的影响。方法向培养的SH-SY5Y细胞加入H2O2100、200、500μmol/L作用24 h诱导产生氧化损伤,应用MTT比色法检测细胞存活率,测定培养液中一氧化氮(NO)含量;并采用流式细胞仪检测细胞凋亡及线粒体膜电位。结果与空白对照组比较,其他实验组随H2O2浓度的加大,细胞存活率、线粒体膜电位逐渐下降,而NO的释放量及细胞凋亡数显著性增多,差异均有统计学意义(P<0.05)。结论 H2O2可引发细胞内NO的产生,使线粒体膜电位下降,导致神经细胞凋亡,从而造成脑细胞损伤,其损伤程度与H2O2浓度呈正相关。
Objective To investigate the effects of exogenous hydrogen peroxide （H2 O2 ） on mitochondrial membrane potential （△φ） in SH SY5Y ceils. Methods Following treatment with 100,200 and 500μmol/L H2O2 for 24 hours,the viability of SH-SY5 Y cells were measured by MTT assay and the content of NO in culture media was determined. The apoptosis of cells and the mito chondrial △φ were detected by using flow cytometry（FCM） and immunofluorescenee histochemical method respectively. Results Along with the increase of the concentration of H2 O2, the content of NO and the apoptotic percentage increased, but the cell viability and △φ decline in SH-SY5Y ceils, compared with untreated cells. Conclusion H2 O2 exposure could cause apoptosis of neurocytes by the induction of the production of NO and the decline of △φ in cells,and the effects might be dependent on the dose of H2O2.
出处
《国际检验医学杂志》
CAS
2011年第15期1665-1667,共3页
International Journal of Laboratory Medicine
基金
国家自然基金资助项目(81041026)
军队中医药科研专项基金资助项目(10ZYZ244)
军队"十一五"指令性课题(08ZL078)
