摘要
从晶体表面宏观迹线配置，提出精确确定各种晶系晶体的取向、计算单晶３个相互垂直表面上基体和孪晶中滑移面和孪生面等边线分布的方法；作为应用实例，精确确定了一种四方点阵结构的Ｔｉ－５６Ａｌ（原子分数，％）单晶的宏观取向，计算和拟合出试样３个不严格垂直表面的指数及其上全部边线分布。
In terms of distributions of macroscopic traces on crystal surfaces, a method was proposed for accurately determining the orientation of crystals for all systems and calculating trace distributions of slip planes and twin planes in both matrix and twin on three surfaces, which are normal to each other, in a single crystal. As an example for application, the macroscopic orientation of Ti-56Al (atomic fraction, %) single crystal with tetragonal lattice was precisely determined, and the indices of three surfaces approximately at right angles and all trace distributions on the surfaces have been calculated and matched.
出处
《金属学报》
SCIE
EI
CAS
CSCD
北大核心
2000年第2期212-216,共5页
Acta Metallurgica Sinica
关键词
晶体表面
宏观迹线
分析方法
Ti-56Al单晶
crystal surface, macroscopic trace, analysis method, Ti-C56Al single crystal
