摘要
提出了当多孔体系的小角X射线散射不遵守Porod定理的情况下 ,应用Debye法 (相关函数法 )和Guinier法(逐级切线法和多级斜线法 )计算它们的平均孔径的方法 .对不同制备条件下部分二氧化硅干凝胶的测试 ,取得了比较一致的结果 ,并与氮气吸附法测定结果进行了对比 .
Small angle X\|ray scattering (SAXS) with synchrotron radiation as X\|ray source has been used to study the structure of SiO\-2 xerogels prepared by sol\|gel process. All SAXS profiles in this paper deviate from Porod's law and show negative or positive deviation. In order to obtain the information of pore in SiO\-2 xerogels, we have proposed the corresponding methods to correct the negative and positive deviations from Porod's law. Then, the average pore diameter of SiO\-2 xerogels is determined with Debye's method and Guinier's method, separately, and the results are found to be close to each other. The average diameters fall in the rangl 3\|25?nm for samples prepared under various conditions. The results of SAXS are also close to that determined by N\-2 adsorption method at 77?K with ASAP2000.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2000年第7期1312-1315,共4页
Acta Physica Sinica
基金
国家自然科学基金 !(批准号 :2 962 5 3 0 7)
关键词
小角X射线散射
二氧化硅干凝胶
平均孔径
small angle X\|ray scattering, SiO\-2 xerogels, average pore diameter
