摘要
３５ＭｅＶ／ｕ Ａｒ离子在室温下辐照了多层堆叠的半晶质聚酯膜，采用傅立叶转换的红外光吸收技术分析和研究了由辐照引起的化学键断裂及其对离子剂量、离子在样品中的平均电子能量损失和吸收剂量的依赖性．结果表明，辐照导致聚酯膜中发生了明显的化学键断裂，断键过程主要发生在反式构型的乙二醇残留物和苯环的对位上，苯环的基本结构在辐照中变化较小．断键不仅强烈地依赖于离子的照射剂量，而且还跟样品中电子能量沉积密切相关，明显的断键发生在４．０ＭＧｙ以上的吸收剂量．
Semicrystalline polyethylene terephthalate foil stacks were irradiated with 35MeV/u Ar ions at room temperature. The induced bond breaking was studied by means of Fourier-transform infrared spectroscopy as functions of ion fluence, the mean electronic ener- gy loss and the absorbed dose. Bond breaking processes mainly take place in the ethylene gly- col residue of the trans configuration and in the para position of benzene rings. The change of benzene ring structures is very small under irradiation. The hand breaking processes strongly depend on both ion fluence and the mean electronic energy loss in PET films. Significant bond breaking is only found at the absorbed dose higher than 4. 0 MGy.
出处
《高能物理与核物理》
EI
CSCD
北大核心
2000年第4期352-358,共7页
High Energy Physics and Nuclear Physics
基金
中国科学院"九五"重点基金!(KI952-S1-423)
国家自然科学基金!(19775058)
西部之光基金资助
关键词
高能氩离子辐照
聚酯膜
红外光吸收
断键
high energy Ar ion irradiation, polyethylene terephthalate, Fourier-transform infrared spectroscopy, bond breaking, absorbed dose
