摘要
提出了一种基于双偏光干涉滤波器的激光波长测量方法,该方法克服了传统偏光干涉装置测量波长时分辨率存在盲区的缺点,通过把粗测和精测两个子系统结合可解决测量的周期性问题。实验结果表明,采用长度为1cm的YVO4晶体作为滤波器,可实现误差小于0.01nm的测量。与基于迈克尔逊干涉仪的波长测量方法相比,所提出的方法无需机械运动部件和参考光源,测量精度满足DWDM光纤通信系统测试的要求。
Based on the principle of polarization interference,a novel laser wavelength measuring method is proposed with dual polarization interference filters,in which the uniformity of wavelength resolution is realized.Combining two subsystems as proposed with different measuring ranges,the wavelength ambiguity due to the periodical response of polarization interference filter is resolved.Experimental results show that the measurement precision of 0.01 nm can be obtained when YVO4 crystal with the length of 1 cm is used as the filter.Compared with the current methods such as ones based on Michelson interferometer,No mechanical components and reference light source is required for the proposed method,and the measurement precision is satisfied for the requirement in the fields of optical fiber communications.
出处
《半导体光电》
CAS
CSCD
北大核心
2013年第3期494-497,共4页
Semiconductor Optoelectronics
基金
国家自然科学基金青年项目(61201193)
陕西省教育厅科技计划资助项目(11JK1006)
关键词
波长测量
双折射晶体
偏光干涉
四象限探测器
wavelength measurement
birefringent crystal
polarization interference
four-quadrant detector
