摘要
利用瞬态X射线衍射技术对LiF单晶沿晶向[100]方向冲击加载的晶格变形进行了诊断研究。实验在神光Ⅱ装置的球形靶上进行,北四路激光驱动Cu靶获得的类He线作为X射线背光源,第九路为加载光源,对大小为7mm×7mm、厚300μm的受激光加载的LiF单晶衍射,实验获得了LiF单晶晶面(200)压缩和未压缩状态的衍射信号。实验结果表明:LiF单晶在激光沿[100]方向冲击加载下,晶格发生了弹性变形,(200)晶面间距变小,衍射线上移,晶格压缩量为11%;该瞬态X射线衍射技术可用于冲击加载下的微观动态响应特性测量。
Transient X-ray diffraction was used to diagnose the elastic deformation of the LiF single crystal which was shocked along the [100] direction. The experiment was implemented in Shenguang II . High-intensity lasers irradiated a thin Cu foil to generate helium-like rays as X ray source, another laser beam irradiated LiF single crystal which was 7 mm× 7 mm in size, 300 um in thickness as the shocked source. Image plate recorded the shocked diffraction signal of the lattice plane （200） as well as the unshocked signal. The experimental results show that the crystal lattice is compressed, lattice spacing in （200） decreases to result in shifting upwards. The positions of the diffraction lines associated with the （200） lattice plane indicate the compression a long [100] direction By 11%. What＇s more, the results show that it is useful for diagnosing the microscopic dynamic response of the material by transient X-ray diffraction.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2014年第2期249-252,共4页
High Power Laser and Particle Beams
基金
国家自然科学青年基金项目(11005098)
关键词
瞬态X射线衍射
LiF单晶
冲击压缩
弹性变形
成像板
transient X-ray diffraction
single crystal LiF
shock compression
elastic deformation
image plate
