摘要
本文对复合掺杂的CeO_2基电解质材料的断口和表面形貌进行了扫描电镜观察,发现用Sm_2O_3和Gd_2O_3共同掺杂CeO_2基电解组质分(CeO_2)_(0.8)(Sm_2O_3)_(0.1)(Gd_2O_3)_(0.1),随着烧结温度的提高,晶粒持续长大,由1400℃烧结时的2～3μm长大到1600℃烧结时的10～12μm,单位尺寸内的晶界数量减少;各温度烧结样品的断口都呈穿晶断裂。随着烧结温度的提高,电导率下降,原因可能是由于晶间玻璃相的增多。
The fracture and surface morphology of ceria-based elelrolyte was observed by SEM.The grain size of ceria-based electrolyte complex stabilized with Sm2O3and Gd2O3 increases continuously from 2 - 3μm to 10 - 12μm with the raise of sintering temperature from 1400℃ to 1600℃ .The number of granular interface in unit area decreases, too.The intercrystalline fracture for samples sintered at different temperature was also obsewed.The electrical conductivity decreases with the increasing of sintering temperature. It may be due to the increasing of intergranu-lar glass phase.
出处
《现代仪器》
2002年第2期27-29,共3页
Modern Instruments
