期刊文献+

基于有限元仿真的IGBT模块的应力应变分析 被引量:1

在线阅读 下载PDF
导出
摘要 IGBT模块是变流器的主要部件,也是功率波动和热冲击的主要承受者,其可靠性直接决定了变流器的可靠性。为研究IGBT模块在老化过程中的应力应变特性,从而进一步从物理机理上分析模块老化失效情况,利用COMSOL软件进行有限元仿真,模拟了模块在损耗加热情况下的应力应变情况。分析了在键合线,键合线焊接点以及焊料层上应力应变较大的原因。总结了应力应变与模块温度、热通量、膨胀系数之间的关系,还通过人为添加空洞的方式,分析了焊料层空洞对模块状态的影响。
出处 《精密制造与自动化》 2017年第3期22-25,40,共5页 Precise Manufacturing & Automation
  • 相关文献

参考文献3

二级参考文献46

  • 1C. Bailey, H Lu, T. Tilford. Predicting the Reliability of Power Electronic Modules[C], ICEPT, 2007.
  • 2S. Yang, D. Xiang, A. Bryant, P. Mawby, L. Ran and P. Tavner Condition Monitoring for Device Reliability in Power Electronic Converters - A Review[J]. IEEE Transactions on Power Electronics, vol.99, 2010.
  • 3S. Yang, A. Bryant, P. Mawby, D. Xiang, L. Ran and P. Tavner, An Industry-Based Survey of Reliability in Power Electronic Converters [J], IEEE Transaction on Industry Applications, 2011.
  • 4G. Coquery, R. Lallemand, D. Wagner, M. Piton, H. Berg, and K Sommer. Reliability improvement of the soldering thermal fatigue with AlSiC technology on traction high-power IGBT modules [C], in European Conference on Power Electronics and Applications (EPE), 1999.
  • 5T. Lee. Design optimization of an integrated liquid-cooled IGBT power module using CFD technique [J], IEEE Trans. on Components and Packaging Technologies, vol. 23, no. 1, pp. 55-60, 2000.
  • 6J. Lehmann, M. Netzel, R. Herzer, and S. Pawel. Method for electrical detection of bond wire lift-off for power semiconductor [C], in International Symposium on Power Semiconductor Devices & IC's (ISPSD), 2003.
  • 7L. Meysenc, M. Jylhakallio and P. Barbosa. Power Electronics Cooling Effectiveness Versus Thermal Inertia, IEEE Trans. on Power Electronics [J], Vol. 20, No. 3, 2005, pp.687-693.
  • 8Y. Han, Y. H. Song. Condition Monitoring Techniques for Electrical Equipment - A Literature Survey, IEEE Trans. on Power Delivery [J], vol. 18, no. 1, pp.4-13, Jan. 2003.
  • 9P.J. Tavner. Review of condition monitoring of rotating electrical machines, IET Electric Power Applications [J], vol. 2, no. 4, pp 215-247, 2008.
  • 10M. Ciappa. Selected failure mechanisms of modern power modules [J]. Micro electronics Reliability vol.42, 2002, pp.653-667.

共引文献34

同被引文献8

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部