摘要
品牌高分辨率时域反射(TDR)以太网电缆(以下简称网线)测试仪价格不菲,较难普及。为此以较低成本设计开发高分辨率TDR网线测试仪,开发中提出两种重要方法:一种是对短路测试提出了短路脉冲差分提取法,此法解决了宽脉冲测试中不能在短路状态下捕获反射脉冲前沿的难题;另一种是在脉冲计时上使用了高分辨率时间数字转换芯片,该芯片的使用不仅简化了测试仪软硬件设计流程,更重要的是保证了测试仪最小测量盲区达到了0. 1 m范围。实验结果表明,TDR网线测试仪测量准确稳定,其软硬件系统运行稳定可靠。
Ethernet cable (hereinafter referred to as the net cable) tester for the brand high resolution time domain reflection (TDR) is expensive and difficult to be popularized.For this reason,a high resolution TDR network tester with a low cost is designed and developed.Two important methods are put forward in the development.One is a short circuit pulse differential extraction method for short circuit test,this method solves the problem of capturing the front of the reflection pulse in the short circuit state of the wide pulse test.The other is to use a high resolution time digital conversion chip on the timing of the pulse.The use of the chip not only simplifies the software and hardware design flow of the tester,but also ensures the minimum measurement blind area of the tester to reach the range of 0.1 m.Finally,the experimental data and trial results show that the TDR network tester is accurate and stable,and its hardware and software systems are stable and reliable.
作者
陈玉
刘永泰
冯红银萍
CHEN Yu;LIU Yongtai;FENG Hongyinping(Information Center,Business College,Shanxi University,Taiyuan 030031,China;School of Mathematical Sciences,Shanxi University,Taiyuan 030006,China)
出处
《实验室研究与探索》
CAS
北大核心
2019年第1期63-68,共6页
Research and Exploration In Laboratory
基金
国家自然科学基金项目(61403239)
关键词
时域反射
以太网
盲区
差分运算
time domain reflection(TDR)
Ethernet
blind zone
difference operation
