摘要
本文通过对三维测量相关的专利文献进行分析,从专利申请趋势、重要申请人等角度对该领域的技术发展概况进行了简要梳理,总结了技术现状,为该领域的进一步研究提供参考。
Based on the analysis of patent documents related to three-dimensional measurement,this paper summarizes the general situation of technology development in this field from the perspective of patent application trend and important applicants,and summarizes the current situation of technology,which provides a reference for further research in this field.
作者
刘祎
Liu Yi(Patent Examination Cooperation(Beijing)Center of the Patent Office,CNIPA,Beijing,100160)
出处
《电子测试》
2019年第17期123-124,共2页
Electronic Test
关键词
三维测量
三坐标测量机
光学测量
非光学测量
专利
three-dimensional measurement
coordinate measuring machine
optical measurement
nonoptical measurement
patent
