摘要
针对当前相关研究成果存在检测结果精度较差等问题,提出一种关于串行通信接口芯片过电压耐受性检测方法。选取几种常见的串行通信接口芯片当作检测对象,并对检测对象相关数据进行分析。分别采用雷电冲击、直流电压、交流电压这三种模式对选取的串行通信接口芯片过电压耐受性进行检测,并记录测试过程中的数据。基于所得数据,从时域和频谱两方面分析所得信号数据。时域分析选取的参量为峰值因子、波形系数、Kurtosis系数、三相电压有效值中的最小值、互相关系数、最大陡度值和陡度均值等,选择经典谱估计法中的周期图法对过电压频谱进行分析。经检测与数据分析得到的实验结果显示,部分芯片受损之后输出的波形严重畸形,还有部分芯片受损之后几乎无法转换电平;对比损坏电压均值,雷电冲击作用下损坏电压均值最高,交流电压次之;该检测结果精度高于文献成果。
In this article,a method for detecting the overvoltage tolerance of serial communication interface chip was proposed.Firstly,several common serial communication interface chips were selected as detection objects,and then,relevant data of detection objects were analyzed.Respectively,the overvoltage tolerance of the selected serial communication interface chip was detected by three modes such as the lightning impulse,DC voltage and AC voltage.Meanwhile,the test data were recorded.Based on these data,the signal data were analyzed through the time domain and spectrum.The parameters selected by the time domain analysis contained the peak factor,the waveform coefficient,Kurtosis coefficient,the minimum of the three-phase voltage valid value,the cross-correlation coefficient,the maximum gradient,and the steepness mean value.Moreover,the periodic graph method in the classical spectral estimation was selected to analyze the overvoltage spectrum.Based on the detection and data analysis,simulation results show that the outputting waveform is seriously deformed after some chips are damaged.Meanwhile,it is almost impossible to convert the electrical level after some chips are damaged.Compared with the mean values of voltages,the mean value of voltage damaged by the lightning impulse is the maximum value,and the AC voltage is the second maximum value.The accuracy of detection result is higher than that of the literature.
作者
董洁
吴国伟
DONG Jie;WU Guo-wei(Dalian University of Technology,Dalian Liaoning 116024,China)
出处
《计算机仿真》
北大核心
2019年第12期327-331,共5页
Computer Simulation
关键词
串行
通信接口
芯片
过电压
耐受性检测
Serial
Communication interface
Chip
Overvoltage
Tolerance detection
