摘要
装置运用平面反射和夫琅禾费单缝衍射规律,以波长为650 nm的半导体激光器为工作光源,入射光经可转动的平面镜发生反射,再通过夫琅禾费单缝发生衍射。被测材料发生微小长度变化时,平面镜被推动,从而转过微小角度θ,反射光线相应地转过2θ,实现了对微小长度变化量的第一次放大。反射光线通过夫琅禾费单缝产生衍射,衍射条纹线性放大了反射光线的位置变化,实现了对微小长度变化量的第二次放大。用光强分布测定仪对衍射条纹的位置进行精细测量,就可以得到被测材料长度的微小变化量。
The apparatus for accurate measurement of the slight variation in length by means of plane reflection and single-slit diffraction was designed according to the theory that single-slit diffraction amplifies slit’s width.Cooperate with rotating flat mirror,the 650 nm semiconductor laser is used as the work light source.Diffraction light changes along with the extension of material,so that it has an extended range of measurement.The intensity distribution apparatus can measure the diffraction fringes accurately.We can know the slight variation in length of the object under test accordingly.We gain the accurate measurement of the slight variation in length by means of enlarge of the reflection and diffraction and measuring multiple diffraction fringes at the same time.
作者
邹艳
许士才
李海彦
王红梅
栗军
ZOU Yan;XU Shicai;LI Haiyan;WANG Hongmei;LI Jun(College of Physics and Electronic Information,Dezhou University,Dezhou 253023,China)
出处
《大学物理实验》
2020年第2期8-14,共7页
Physical Experiment of College
基金
中国高等教育学会高等教育科学研究“十三五”规划课题2018年度工程教育专项课题(2018GCLYB11)。
关键词
精细测量
平面反射
单缝衍射
微小长度变化
accurate measurement
plane reflection
single-slit diffraction
slight variation in length
