摘要
基于主动式双波长红外激光的测温方法,可实现对未知发射率表面真实温度的测量。高精度的标定源是保证双波长红外测温系统测温精确性的重要基础,但目前双波长测温领域的研究工作缺乏关于标定实验结果的公开报道。因此,设计搭建了主动式红外激光测温标定源,研究该标定源的稳定性和均匀性,并对双波长激光测温系统进行标定。结果表明:所搭建主动式双波长红外激光测温标定源稳定性良好,1173 K时20 min内温度最大偏差为0.22 K;表面温度均匀性良好,1173 K时表面温度标准偏差为0.34 K;标定源表面真温在923 K以上时,采集信号相对标准偏差小于0.7%。标定实验结果证明所搭建标定源可靠性良好,能够对主动式双波长红外激光测温系统进行精确标定。
Based on active dual-wavelength infrared laser thermometry method,it is possible to measure the true surface temperature when the emissivity is unknown.A high-precision calibration source is an important basis for the accuracy of dual-wavelength infrared thermometry system.However,there is a lack of public reports on such calibration sources in the current research work in the field of dual-wavelength temperature measurement.Therefore,an active infrared laser temperature measuring source is designed and built to study the stability and uniformity of the calibration source,and the dual-wavelength laser thermometry system is calibrated.The results show that the active dual-wavelength infrared laser temperature calibration source has good stability,and the maximum temperature deviation within 20 minutes at 1173 K is 0.22 K;the surface temperature uniformity is well,and the standard deviation of the surface temperature at 1173 K is 0.34 K.When the true temperature of the source surface is above 923 K,the relative standard deviation of the collected signal is less than 0.7%.The calibration experiment results show that the calibration source has good reliability for the accurate calibration of the active dual-wavelength infrared laser temperature measurement system.
作者
曲岩
宦克为
安保林
董伟
赵云龙
宋旭尧
原遵东
QU Yan;HUAN Ke-wei;AN Bao-lin;DONG Wei;ZHAO Yun-long;SONG Xu-yao;YUAN Zun-dong(Changchun University of Science and Technology,Changchun,Jilin 130022,China;National Institute of Metrology,Beijing 100029,China)
出处
《计量学报》
CSCD
北大核心
2021年第2期137-143,共7页
Acta Metrologica Sinica
基金
国家自然科学基金(11772318,51706235)
吉林省科技发展计划项目(20190701024GH)。
关键词
计量学
双波长红外激光测温法
辐射测温
发射率
标定
metrology
dual-wavelength infrared laser thermometry method
radiation thermometry
emissivity
calibration