摘要
相频扫描阵列具有频扫低成本和相扫控制灵活等优点,被广泛用于军事和民事。该类阵列的增益、相位扫描面波束副瓣等受通道的幅度相位一致性影响较大,需要经过校准补偿以获得高性能波束。准确高效的通道幅相测试方法是进行校准的前提和基础。文中首先分析了组成相频扫描阵列的波导缝隙天线近场区域的辐射特性,得出在柱面波区域进行取样的可行性。在此基础上提出了扫描架逐行移动取样以及中场取样两类共五种测试方法,并给出了程差的幅相补偿方法。计算了各测试方法所引入的系统误差,分析了它们各自的适用场合。最后对比其中两种测试方法在某相频扫描阵列样机中的幅相测试结果,并给出了补偿校准后的波束测试结果,验证了文中所提出测试方法的准确性和有效性。
Phase-frequency scanning array is widely used in military and civil affairs for its low cost of frequency scanning and flexible phase sweep control. The gain and phase scan beam sidelobe of the array are greatly affected by the amplitude and phase consistency of the channel and need to be calibrated and compensated to obtain high performance beam. Accurate and efficient channel amplitude and phase test method is the premise and foundation of calibration. The radiation characteristics of the waveguide slot antenna in the near-field region of phase scan array are analyzed and the feasibility of sampling in the cylindrical wave region is obtained. On the basis of this, five testing methods, including row by row moving sampling of scanning frame and midfield sampling, are proposed, and the amplitude and phase compensation method of path difference is given. The systematic errors induced by each test method are calculated and their applications are analyzed. Finally, the amplitude-phase test results of the two methods in a phase-frequency scanning array prototype are compared, and the beam test results after compensation calibration are given to verify the accuracy and effectiveness of the proposed method.
作者
杨磊
于大群
毛建军
YANG Lei;YU Da-qun;MAO Jian-jun(The 14th Research Institute of CETC,Nanjing 210039,China)
出处
《微波学报》
CSCD
北大核心
2022年第2期80-85,共6页
Journal of Microwaves
关键词
相频扫描阵列
通道测试
频扫天线
阵列校准
phase-frequency scanning array
channel test
frequency scanning antenna
array calibration
