摘要
激光注入技术是评估安全芯片抗故障攻击能力的重要手段之一.本文详细分析了激光故障注入的原理及激光诱发现场可编程门阵列(Field Programmable Gate Array,FPGA)触发器结构故障的机制,提出了一种FPGA激光注入评测方法.分别采用随机和定点故障注入的方法,对基于FPGA实现的SM2算法的基点等数据进行了篡改,验证了防护设计的有效性.针对28 nm工艺的FPGA,激光能够实现指定字节的单比特故障注入,同时也能实现快速的高覆盖率随机故障注入,是一种精确和高效的安全芯片评测手段.
Laser injection technology is one of the essential methods to evaluate the ability of security chips to resist failure attacks.In this paper,the principle of laser fault injection and the mechanism of laser-induced structural failure of FP⁃GA(Fiele Programmable Gate Array)trigger are analyzed in detail,and an evaluation method of FPGA laser injection is pro⁃posed.The random and fixed-point fault injection method are adopted respectively to tamper with the basic point data of the SM2 algorithm based on FPGA,and the effectiveness of the protection design is verified.Aiming at the FPGA of 28nm pro⁃cess,the laser can achieve the single bit fault injection of specified byte and perform the fast random fault injection of high coverage rate.It is an accurate and efficient means of safety chip evaluation.
作者
蔡莹
朱翔
王舰
李昊远
韩建伟
CAI Ying;ZHU Xiang;WANG Jian;LI Hao-yuan;HAN Jian-wei(National Space Science Center,Chinese Academy of Sciences,Beijing 100190,China;University of Chinese Academy of Sciences,Beijing 100049,China;Institute of Software Chinese Academy of Sciences,Beijing 100190,China)
出处
《电子学报》
EI
CAS
CSCD
北大核心
2022年第10期2381-2386,共6页
Acta Electronica Sinica
基金
国防科工局技术基础科研项目(No.JSHS2019203B001)
中国科学院青促会研究奖励基金(No.2018179)。
