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In situ non-destructive measurement of Josephson junction resistance using fritting contact technique

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摘要 Conventional four-probe methods for measuring the resistance of Josephson junctions can damage superconducting thin films,making them unsuitable for frequency measurements of superconducting qubits.In this study,we present a custom probe station measurement system that employs the fritting contact technique to achieve in situ,non-destructive measurements of Josephson junction resistance.Our experimental results demonstrate that this method allows for accurate prediction of qubit frequency with an error margin of 17.2 MHz.Moreover,the fritting contact technique does not significantly affect qubit coherence time or the integrity of the superconducting film,confirming its non-destructive nature.This innovative approach provides a dependable foundation for frequency tuning and addressing frequency collision issues,thus supporting the advancement and practical deployment of superconducting quantum computing.
作者 Lei Du Hao-Ran Tao Liang-Liang Guo Hai-Feng Zhang Yong Chen Xin Tian Chi Zhang Zhi-Long Jia Peng Duan Guo-Ping Guo 杜磊;陶浩然;郭亮亮;张海峰;陈勇;田昕;张驰;贾志龙;段鹏;郭国平(CAS Key Laboratory of Quantum Information,University of Science and Technology of China,Hefei 230026,China;CAS Center for Excellence and Synergetic Innovation Center in Quantum Information and Quantum Physics,University of Science and Technology of China,Hefei 230026,China;Origin Quantum Computing Technology (Hefei) Co.,Ltd.,Hefei 230088,China)
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第11期57-61,共5页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China(Grant Nos.12034018 and 11625419).
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