摘要
本文针对电子学中电子线路板上元器件通电后要精确测量其温度的问题引入了激光拉曼散射光谱技术,介绍了该方法在无损伤探测电子元器件(通各种电流后)表面温度方面的应用,为设计电子线路板散热问题提供了可参考的数据。并开拓了激光拉曼散射光谱技术在电子学中的应用,也同时为测量复杂结构物体表面温度提供了较好的方法。
Especially for the accurately detection of the temperature on the surface of the complex electronic components, Raman scattering technique, a widely used method in physics, and its detection principle and the constitution of the detection system are introduced. The results give a valuable referable data for planning the radiation of electronic breadboard. This work expands the working field of Raman scattering technique, and provide a good method for detecting the temperature of the complex matters.
出处
《光散射学报》
2003年第2期78-81,共4页
The Journal of Light Scattering
