摘要
为了防止空间应用SRAM出现SEU错误累积,提出了一种优化的读→校验→回写刷新机制.该机制实时监测处理器状态,当处理器对外部主存进行读操作时,由存储器控制器自主地(即不需处理器干预)对读操作的存储单元进行刷新操作;当处理器进行访问外部主存以外的其他操作时,由存储器控制器自主的对所有的存储单元进行遍历式刷新操作,该机制可以避免长时间未被读的存储单元发生SEU错误的累积,保证SRAM单元中发生错误的比特位数小于校验码的纠检错能力.最后,通过向SRAM随机注错的方法对本机制的存储器控制器进行验证,结果表明存储器控制器满足设计要求.
To prevent the accumulation of SEU errors in the SRAM of space application ,this paper puts forward an optimized scrubbing mechanism featuring with reading ,checking and writing back .The mechanism makes a real-time monitor for the processor state .When the processor requests the external main memory to read ,the memory controller will scrub the storage unit which was reading without CPU intervention .While the processor has no operation on main memory ,the memory controller is of independence to refresh all SRAM cells ,which is traverse type .The mechanism can avoid SEU errors accumulation in SRAM cells which has not been read for a long time , and guarantee that the error bits in an SRAM cell is less than the check code error detection ability .Finally ,this paper makes the memory controller which is implemented the scrubbing mechanism a verification ,the results show that the memory controller can archive the design requirements .
出处
《微电子学与计算机》
CSCD
北大核心
2014年第7期113-117,共5页
Microelectronics & Computer
