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加速寿命老化测试在连接器烧毁分析中的应用 被引量:1
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作者 王乐涛 《电子质量》 2023年第6期37-41,共5页
随着技术的进步,大电流连接器端子被广泛地应用在家电中,如加热管、电机和门锁等,伴随而来的连接器烧毁的问题也越来越多。根据连接器的应用环境,通过加速寿命老化测试,可以模拟重现失效现象。给出了一个典型的烧毁案例的模拟及失效分... 随着技术的进步,大电流连接器端子被广泛地应用在家电中,如加热管、电机和门锁等,伴随而来的连接器烧毁的问题也越来越多。根据连接器的应用环境,通过加速寿命老化测试,可以模拟重现失效现象。给出了一个典型的烧毁案例的模拟及失效分析的过程,通过比较失效和完好的样品,找到了失效根源。运用这种方法,对不同环境应用的连接器,通过改变模拟参数,可以在实验室成功复现失效现象,进而发现产品的薄弱点,为改善产品质量提供参考依据。 展开更多
关键词 加速寿命老化测试 连接器烧毁 浴盆曲线 失效分析 失效树
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Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
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作者 Jian HAO Lei JING +5 位作者 Hong-liang KE Yao WANG Qun GAO Xiao-xun WANG Qiang SUN Zhi-jun XU 《Frontiers of Information Technology & Electronic Engineering》 SCIE EI CSCD 2017年第8期1197-1204,共8页
To acquire a rational minimum cut-off time and the precision of lifetime prediction with respect to cut-off time for the accelerated aging test of LED lamps, fifth-order moving average error estimation is adopted in t... To acquire a rational minimum cut-off time and the precision of lifetime prediction with respect to cut-off time for the accelerated aging test of LED lamps, fifth-order moving average error estimation is adopted in this paper. Eighteen LED lamps from the same batch are selected for two accelerated aging tests, with 10 samples at 80 ℃ and eight samples at 85 ℃. First, the accelerated lifetime of each lamp is acquired by exponential fitting of the lumen maintenances of the lamp for a certain cut-offtime With the acquired lifetimes of all lamps, the two-parameter Weibull distribution of the failure probability is obtained, and the medium lifetime is calculated. Then, the precision of the medium lifetime prediction for different cut-off times is obtained by moving average error estimation. It is shown that there exists a minimum cut-off time for the accelerated aging test, which can be determined by the variation of the moving average error versus the cut-offtime. When the cut-off time is less than this value, the lifetime estimation is irrational. For a given cut-off time, the precision of lifetime prediction can be computed by average error evaluation, and the error of lifetime estimation decreases gradually as the cut-off time- increases. The minimum cut-off time and medium lifetime of LED lamps are both sensitive to thermal stress. The minimum cut-off time is 1104 h with the lifetime esti- mation error of 1.15% for the test at 80 ~C, and 936 h with the lifetime estimation error of 1.24% for the test at 85 ℃. With the lifetime estimation error of about 0.46%, the median lifetimes are 7310 h and 4598 h for the tests at 80 ℃ and 85℃, respectively. 展开更多
关键词 LED lamp Accelerated aging test Medium lifetime Moving average error
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