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新闻热播节目的无介质化播出设计与实现 被引量:1
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作者 吐尔逊江·买买提 《广播与电视技术》 2020年第12期65-69,共5页
本文所述的新闻热播节目的无介质化播出系统经改造后,有效解决了我台原电视播出系统中新闻热播录像机为单一溃点问题,降低事故隐患点,增强了播出系统安全运行能力,为新闻类节目的安全播出起到了保驾护航作用。
关键词 新闻热播 无介质化 安全播出
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High Performance 70nm CMOS Devices
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作者 徐秋霞 钱鹤 +5 位作者 殷华湘 贾林 季红浩 陈宝钦 朱亚江 刘明 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第2期134-139,共6页
A high performance 70nm CMOS device has been demonstrated for the first time in the continent, China. Some innovations in techniques are applied to restrain the short channel effect and improve the driving ability, ... A high performance 70nm CMOS device has been demonstrated for the first time in the continent, China. Some innovations in techniques are applied to restrain the short channel effect and improve the driving ability, such as 3nm nitrided oxide, dual poly Si gate electrode, novel super steep retrograde channel doping by heavy ion implantation, ultra shallow S/D extension formed by Ge PAI(Pre Amorphism Implantation) plus LEI(Low Energy Implantation), thin and low resistance Ti SALICIDE by Ge PAI and special cleaning, etc. The shortest channel length of the CMOS device is 70nm. The threshold voltages, G m and off current are 0 28V,490mS·mm -1 and 0 08nA/μm for NMOS and -0 3V,340mS·mm -1 and 0 2nA/μm for PMOS, respectively. Delays of 23 5ps/stage at 1 5V, 17 5ps/stage at 2 0V and 12 5ps/stage at 3V are achieved in the 57 stage unloaded 100nm CMOS ring oscillator circuits. 展开更多
关键词 high performance 70nm CMOS device S/D extension nitrided gate oxide Ge PAI SALICIDE
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