This paper investigates the flux distributions of the electron photo-detached from Hion localized in a gradient electric field. In contrast with the photodetachment in the uniform electric field [Phys, Rev. A 40 （198...This paper investigates the flux distributions of the electron photo-detached from Hion localized in a gradient electric field. In contrast with the photodetachment in the uniform electric field [Phys, Rev. A 40 （1989） 4983], where only two electron trajectories interfere at each given point on a detector, for the photodetachment in a gradient electric field, the electrons waves can travel along multiple paths from the negative ion to a given point on the detector plane, which makes the electron flux distributions on the detector plane become much complex. Using the semi-classicaJ theory, we put forward a formula for calculating the electron flux. Our calculation results suggest that the electron flux distributions on a given detector plane is not only related to the propagation time of the detached electron, but also related to the detached electron＇s energy. With the increase of the detached electron＇s energy, the oscillating region in the electron flux distributions becomes enlarged and the oscillating structure in the flux distributions becomes much more complicated. This study will guide future experiment research on the photodetachment microscopy of the negative ions in the presence of non-uniform external fields.展开更多
基金Supported by the National Natural Science Foundation of China under Grant Nos.11374133 and 11074104a Project of Shandong Province Higher Educational Science and Technology Program of China under Grant No.J13LJ04
文摘This paper investigates the flux distributions of the electron photo-detached from Hion localized in a gradient electric field. In contrast with the photodetachment in the uniform electric field [Phys, Rev. A 40 （1989） 4983], where only two electron trajectories interfere at each given point on a detector, for the photodetachment in a gradient electric field, the electrons waves can travel along multiple paths from the negative ion to a given point on the detector plane, which makes the electron flux distributions on the detector plane become much complex. Using the semi-classicaJ theory, we put forward a formula for calculating the electron flux. Our calculation results suggest that the electron flux distributions on a given detector plane is not only related to the propagation time of the detached electron, but also related to the detached electron＇s energy. With the increase of the detached electron＇s energy, the oscillating region in the electron flux distributions becomes enlarged and the oscillating structure in the flux distributions becomes much more complicated. This study will guide future experiment research on the photodetachment microscopy of the negative ions in the presence of non-uniform external fields.
