A 13bit,pipelined analog-to-digital converter （ADC） designed to achieve high linearity is described. The high linearity is realized by using the passive capacitor error-averaging technique to calibrate the capacitor...A 13bit,pipelined analog-to-digital converter （ADC） designed to achieve high linearity is described. The high linearity is realized by using the passive capacitor error-averaging technique to calibrate the capacitor mismatch error, a gain-boosting opamp to minimize the finite gain error and gain nonlinearity,a bootstrapping switch to reduce the switch on-resistor nonlinearity, and an anti-disturb design to reduce the noise from the digital supply. This ADC is implemented in 0.18μm CMOS technology and occupies a die area of 3.2mm^2 , including pads. Measured performance includes - 0.18/ 0.15LSB of differential nonlinearity, -0.35/0.5LSB of integral nonlinearity, 75.7dB of signal-to-noise plus distortion ratio （SNDR） and 90. 5 dBc of spurious-free dynamic range （SFDR） for 2.4MHz input at 2.5MS/s. At full speed conversion （5MS/s） and for the same 2.4MHz input, the measured SNDR and SFDR are 73.7dB and 83.9 dBc, respectively. The power dissipation including output pad drivers is 21mW at 2.5MS/s and 34mW at 5MS/s,both at 2.7V supply.展开更多
A novel, highly linear sampling switch suitable for low-voltage operation is proposed. This switch not only eliminates the nonlinearity introduced by gate-source voltage variation, but also reduces the nonlinearity re...A novel, highly linear sampling switch suitable for low-voltage operation is proposed. This switch not only eliminates the nonlinearity introduced by gate-source voltage variation, but also reduces the nonlinearity resuiting from threshold voltage variation, which has not been accomplished in earlier low-voltage sampling switches. This is achieved by adopting a replica transistor with the same threshold voltage as the sampling transistor. The effectiveness of this technique is demonstrated by a prototype design of a sampling switch in 0. 35μm. The proposed sampling switch achieves a spurious free dynamic range of 111dB for a 0. 2MHz, 1.2Vp-p input signal, sampled at a rate of 2MS/s,about 18dB over the Bootstrapped switch. Also, the on-resistance variation is reduced by 90%. This method is especially useful for low-voltage, high resolution ADCs, which is a hot topic today.展开更多
An improved structure of linear transconductor is presented in this paper. It is analyzed in theory and simulated with Spectre based on 0.25μm CMOS process. The simulation results show that the differential input vol...An improved structure of linear transconductor is presented in this paper. It is analyzed in theory and simulated with Spectre based on 0.25μm CMOS process. The simulation results show that the differential input voltage of the proposed transconductor is 4.0Vpp(peak to peak), whereas the differential input voltage of the existing source degeneration structure is 2.2Vpp, when their nonlinear errors are required to be less than 0.15%.展开更多
We propose a scheme of quantum computation with nonlinear quantum optics. Polarization states of photons are used for qubits. Photons with different frequencies represent different qubits. Single qubit rotation operat...We propose a scheme of quantum computation with nonlinear quantum optics. Polarization states of photons are used for qubits. Photons with different frequencies represent different qubits. Single qubit rotation operation is implemented through optical elements like the Faraday polarization rotator. Photons are separated into different optical paths, or merged into a single optical path using dichromatic mirrors. The controlled-NOT gate between two qubits is implemented by the proper combination of parametric up and down conversions. This scheme has the following features： （1） No auxiliary qubits are required in the controlled-NOT gate operation; （2） No measurement is required in the course of the computation; （3） It is resource efficient and conceptually simple.展开更多
A 10-bit single-slope analog-to-digital converter (ADC) for time-delay-integration CMOS image sensor was proposed. A programmable ramp generator was applied to accomplish the error calibration and improve the linearit...A 10-bit single-slope analog-to-digital converter (ADC) for time-delay-integration CMOS image sensor was proposed. A programmable ramp generator was applied to accomplish the error calibration and improve the linearity. The ADC was fabricated in a 180 nm 1P4M CMOS process. Experimental results indicate that the differential nonlinearity and integral nonlinearity were 0.51/-0.53 LSB and 0.63/-0.71 LSB, respectively. The sampling rate of the ADC was 32 kHz.展开更多
文摘A 13bit,pipelined analog-to-digital converter （ADC） designed to achieve high linearity is described. The high linearity is realized by using the passive capacitor error-averaging technique to calibrate the capacitor mismatch error, a gain-boosting opamp to minimize the finite gain error and gain nonlinearity,a bootstrapping switch to reduce the switch on-resistor nonlinearity, and an anti-disturb design to reduce the noise from the digital supply. This ADC is implemented in 0.18μm CMOS technology and occupies a die area of 3.2mm^2 , including pads. Measured performance includes - 0.18/ 0.15LSB of differential nonlinearity, -0.35/0.5LSB of integral nonlinearity, 75.7dB of signal-to-noise plus distortion ratio （SNDR） and 90. 5 dBc of spurious-free dynamic range （SFDR） for 2.4MHz input at 2.5MS/s. At full speed conversion （5MS/s） and for the same 2.4MHz input, the measured SNDR and SFDR are 73.7dB and 83.9 dBc, respectively. The power dissipation including output pad drivers is 21mW at 2.5MS/s and 34mW at 5MS/s,both at 2.7V supply.
文摘A novel, highly linear sampling switch suitable for low-voltage operation is proposed. This switch not only eliminates the nonlinearity introduced by gate-source voltage variation, but also reduces the nonlinearity resuiting from threshold voltage variation, which has not been accomplished in earlier low-voltage sampling switches. This is achieved by adopting a replica transistor with the same threshold voltage as the sampling transistor. The effectiveness of this technique is demonstrated by a prototype design of a sampling switch in 0. 35μm. The proposed sampling switch achieves a spurious free dynamic range of 111dB for a 0. 2MHz, 1.2Vp-p input signal, sampled at a rate of 2MS/s,about 18dB over the Bootstrapped switch. Also, the on-resistance variation is reduced by 90%. This method is especially useful for low-voltage, high resolution ADCs, which is a hot topic today.
文摘An improved structure of linear transconductor is presented in this paper. It is analyzed in theory and simulated with Spectre based on 0.25μm CMOS process. The simulation results show that the differential input voltage of the proposed transconductor is 4.0Vpp(peak to peak), whereas the differential input voltage of the existing source degeneration structure is 2.2Vpp, when their nonlinear errors are required to be less than 0.15%.
基金The project supported by the National Fundamental Research Program under Grant No.2006CB921106National Natural Science Foundation of China under Grant Nos.10325521 and 10390160
文摘We propose a scheme of quantum computation with nonlinear quantum optics. Polarization states of photons are used for qubits. Photons with different frequencies represent different qubits. Single qubit rotation operation is implemented through optical elements like the Faraday polarization rotator. Photons are separated into different optical paths, or merged into a single optical path using dichromatic mirrors. The controlled-NOT gate between two qubits is implemented by the proper combination of parametric up and down conversions. This scheme has the following features： （1） No auxiliary qubits are required in the controlled-NOT gate operation; （2） No measurement is required in the course of the computation; （3） It is resource efficient and conceptually simple.
基金Supported by National Natural Science Foundation of China (No. 61036004 and No. 61076024)
文摘A 10-bit single-slope analog-to-digital converter (ADC) for time-delay-integration CMOS image sensor was proposed. A programmable ramp generator was applied to accomplish the error calibration and improve the linearity. The ADC was fabricated in a 180 nm 1P4M CMOS process. Experimental results indicate that the differential nonlinearity and integral nonlinearity were 0.51/-0.53 LSB and 0.63/-0.71 LSB, respectively. The sampling rate of the ADC was 32 kHz.
