In Corley′s algorithm for all efficient spanning trees, final solutions include many spanning trees, which are not all efficient. In this paper, a new algorithm is presented, which corrects and modifies Corley′s alg...In Corley′s algorithm for all efficient spanning trees, final solutions include many spanning trees, which are not all efficient. In this paper, a new algorithm is presented, which corrects and modifies Corley′s algorithm. A necessary condition is developed for the subtree of an efficient spanning tree. According to the condition the new algorithm is established and its efficiency is proved.展开更多
In this paper the structure-based test generation algorithm has been studied for the problem that test patterns are obtained by determined finite faults set in the past. This Algorithm can find out all test patterns o...In this paper the structure-based test generation algorithm has been studied for the problem that test patterns are obtained by determined finite faults set in the past. This Algorithm can find out all test patterns one tithe, so faults detection is very convenient. By simulation, the smallest test patterns set can be obtained and faults coverage rate is 100%.展开更多
On the basis of EST (Equivalent STate hashing) algorithm, this paper researches a kind of test generation algorithm based on search state dominance for combinational circuit. According to the dominance relation of the...On the basis of EST (Equivalent STate hashing) algorithm, this paper researches a kind of test generation algorithm based on search state dominance for combinational circuit. According to the dominance relation of the E-frontier (evaluation frontier), we can prove that this algorithm can terminate unnecessary searching step of test pattern earlier than the EST algorithm through some examples, so this algorithm can reduce the time of test generation. The test patterns calculated can detect faults given through simulation.展开更多
Aimed at the generation of high-quality test set in the shortest possible time, the test generation for combinational circuits （CC） based on the chaotic particle swarm optimization （CPSO） algorithm is presented ac...Aimed at the generation of high-quality test set in the shortest possible time, the test generation for combinational circuits （CC） based on the chaotic particle swarm optimization （CPSO） algorithm is presented according to the analysis of existent problems of CC test generation, and an appropriate CPSO algorithm model has been constructed. With the help of fault simulator, the test set of ISCAS＇ 85 benchmark CC is generated using the CPSO, and some techniques are introduced such as half-random generation, and simulation of undetected fauhs.with original test vector, and inverse test vector. Experimental results show that this algorithm can generate the same fault coverage and small-size test set in short time compared with other known similar methods, which proves that the proposed method is applicable and effective.展开更多
文摘In Corley′s algorithm for all efficient spanning trees, final solutions include many spanning trees, which are not all efficient. In this paper, a new algorithm is presented, which corrects and modifies Corley′s algorithm. A necessary condition is developed for the subtree of an efficient spanning tree. According to the condition the new algorithm is established and its efficiency is proved.
文摘In this paper the structure-based test generation algorithm has been studied for the problem that test patterns are obtained by determined finite faults set in the past. This Algorithm can find out all test patterns one tithe, so faults detection is very convenient. By simulation, the smallest test patterns set can be obtained and faults coverage rate is 100%.
文摘On the basis of EST (Equivalent STate hashing) algorithm, this paper researches a kind of test generation algorithm based on search state dominance for combinational circuit. According to the dominance relation of the E-frontier (evaluation frontier), we can prove that this algorithm can terminate unnecessary searching step of test pattern earlier than the EST algorithm through some examples, so this algorithm can reduce the time of test generation. The test patterns calculated can detect faults given through simulation.
文摘Aimed at the generation of high-quality test set in the shortest possible time, the test generation for combinational circuits （CC） based on the chaotic particle swarm optimization （CPSO） algorithm is presented according to the analysis of existent problems of CC test generation, and an appropriate CPSO algorithm model has been constructed. With the help of fault simulator, the test set of ISCAS＇ 85 benchmark CC is generated using the CPSO, and some techniques are introduced such as half-random generation, and simulation of undetected fauhs.with original test vector, and inverse test vector. Experimental results show that this algorithm can generate the same fault coverage and small-size test set in short time compared with other known similar methods, which proves that the proposed method is applicable and effective.
