Register allocation in high-level circuit synthesis is important not only for reducing area, delay, and power overheads, but also for improving the testability of the synthesized circuits. This paper presents an impro...Register allocation in high-level circuit synthesis is important not only for reducing area, delay, and power overheads, but also for improving the testability of the synthesized circuits. This paper presents an improved register allocation algorithm that improves the testability called weighted graph-based balanced register allocation for high-level circuit synthesis. The controllability and observability of the registers and the self-loop elimination are analyzed to form a weighted conflict graph, where the weight of the edge between two nodes denotes the tendency of the two variables to share the same register. Then the modified desaturation algorithm is used to dynamically modify the weights to obtain a final balanced register allocation which improves the testability of the synthesized circuits a higher fault coverage than other algorithms with Tests on some benchmarks show that the algorithm gives less area overhead and even less time delay.展开更多
Scheduling is an important step in high-level synthesis and can greatly influence the testability of the synthesized circuits. This paper presents an efficient testability-improved data path scheduling scheme based on...Scheduling is an important step in high-level synthesis and can greatly influence the testability of the synthesized circuits. This paper presents an efficient testability-improved data path scheduling scheme based on mobility scheduling, in which the scheduling begins from the operation with least mobility. In our data path scheduling scheme, the lifetimes of the I/O variables are made as short as possible to enlarge the possibility of the intermediate variables being allocated to the I/O registers. In this way, the controllability/observability of the intermediate variables can be improved. Combined with a weighted graph-based register allocation method, this scheme can obtain better testability. Experimental results on some benchmarks and example circuits show that the proposed scheme can get higher fault coverage compared with other scheduling schemes at little area overhead and even less time delay.展开更多
In the course of high-level synthesis of integrate circuit, the hard-to-test structure caused by irrational schedule and allocation reduces the testability of circuit. In order to improve the circuit testability, this...In the course of high-level synthesis of integrate circuit, the hard-to-test structure caused by irrational schedule and allocation reduces the testability of circuit. In order to improve the circuit testability, this paper proposes a weighted compatibility graph (WCG), which provides a weighted formula of compatibility graph based on register allocation for testability and uses improved weighted compatibility clique partition algorithm to deal with this WCG. As a result, four rules for testability are considered simultaneously in the course of register allocation so that the objective of improving the design of testability is acquired. Tested by many experimental results of benchmarks and compared with many other models, the register allocation algorithm proposed in this paper has greatly improved the circuit testability with little overhead on the final circuit area.展开更多
提出了一种在高层次综合的寄存器分配过程中考虑可测性的算法。该算法在将一个调度好的CDFG(Control Data Flow Graph)的变量分配到相应的寄存器的过程中，通过对未能分配复用到输入、输出寄存器的变量进行可测性处理，达到提高设计可...提出了一种在高层次综合的寄存器分配过程中考虑可测性的算法。该算法在将一个调度好的CDFG(Control Data Flow Graph)的变量分配到相应的寄存器的过程中，通过对未能分配复用到输入、输出寄存器的变量进行可测性处理，达到提高设计可测性的目的。同时在进行可测性处理的时候，定义了CDFG的节点的可测性测度方法。展开更多
基金Supported by the National Key Basic Research and Development(973) Program of China (No. 2005CB321604)the National Natural Science Foundation of China (No. 60633060)
文摘Register allocation in high-level circuit synthesis is important not only for reducing area, delay, and power overheads, but also for improving the testability of the synthesized circuits. This paper presents an improved register allocation algorithm that improves the testability called weighted graph-based balanced register allocation for high-level circuit synthesis. The controllability and observability of the registers and the self-loop elimination are analyzed to form a weighted conflict graph, where the weight of the edge between two nodes denotes the tendency of the two variables to share the same register. Then the modified desaturation algorithm is used to dynamically modify the weights to obtain a final balanced register allocation which improves the testability of the synthesized circuits a higher fault coverage than other algorithms with Tests on some benchmarks show that the algorithm gives less area overhead and even less time delay.
基金the National Key Basic Research and Development (973) of China (No. 2005CB321604)the National Natural Science Foundation of China (No. 60633060)
文摘Scheduling is an important step in high-level synthesis and can greatly influence the testability of the synthesized circuits. This paper presents an efficient testability-improved data path scheduling scheme based on mobility scheduling, in which the scheduling begins from the operation with least mobility. In our data path scheduling scheme, the lifetimes of the I/O variables are made as short as possible to enlarge the possibility of the intermediate variables being allocated to the I/O registers. In this way, the controllability/observability of the intermediate variables can be improved. Combined with a weighted graph-based register allocation method, this scheme can obtain better testability. Experimental results on some benchmarks and example circuits show that the proposed scheme can get higher fault coverage compared with other scheduling schemes at little area overhead and even less time delay.
基金the National Natural Science Foundation of China (No.60273081)
文摘In the course of high-level synthesis of integrate circuit, the hard-to-test structure caused by irrational schedule and allocation reduces the testability of circuit. In order to improve the circuit testability, this paper proposes a weighted compatibility graph (WCG), which provides a weighted formula of compatibility graph based on register allocation for testability and uses improved weighted compatibility clique partition algorithm to deal with this WCG. As a result, four rules for testability are considered simultaneously in the course of register allocation so that the objective of improving the design of testability is acquired. Tested by many experimental results of benchmarks and compared with many other models, the register allocation algorithm proposed in this paper has greatly improved the circuit testability with little overhead on the final circuit area.
文摘提出了一种在高层次综合的寄存器分配过程中考虑可测性的算法。该算法在将一个调度好的CDFG(Control Data Flow Graph)的变量分配到相应的寄存器的过程中，通过对未能分配复用到输入、输出寄存器的变量进行可测性处理，达到提高设计可测性的目的。同时在进行可测性处理的时候，定义了CDFG的节点的可测性测度方法。
