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DESIGN OF TERNARY CURRENT-MODE CMOS CIRCUITS BASED ON SWITCH-SIGNAL THEORY 被引量:4
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作者 吴训威 邓小卫 应时彦 《Journal of Electronics(China)》 1993年第3期193-202,共10页
By applying switch-signal theory, the interaction between MOS transmission switch-ing transistor and current signal in current-mode CMOS circuits is analyzed, and the theory oftransmission current-switches which is su... By applying switch-signal theory, the interaction between MOS transmission switch-ing transistor and current signal in current-mode CMOS circuits is analyzed, and the theory oftransmission current-switches which is suitable to current-mode CMOS circuits is proposed. Thecircuits, such as ternary full-adder etc., designed by using this theory have simpler circuit struc-tures and correct logic functions. It is confirmed that this theory is efficient in guiding the logicdesign of current-mode CMOS circuits at switch level. 展开更多
关键词 Switch-signal THEORY THEORY of transmission current-switches Multivalued LOGIC current-mode cmos circuit
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DESIGN OF SYMMETRIC TERNARY CURRENT-MODE CMOS CIRCUITS
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作者 Shen Jizhong Chen Xiexiong Yao maoqun(Dept. Electronic Engineering, Hangzhou University, Hangzhou 310028) 《Journal of Electronics(China)》 1997年第4期336-344,共9页
By applying switch-signal theory, the theory of transmission current-switches based on symmetric ternary logic is proposed, this theory is suitable to design symmetric ternary current-mode CMOS circuits. The symmetric... By applying switch-signal theory, the theory of transmission current-switches based on symmetric ternary logic is proposed, this theory is suitable to design symmetric ternary current-mode CMOS circuits. The symmetric ternary current-mode CMOS circuits designed by using this theory not only have simpler circuit structures and correct logic functions, but also can process bidirectional signals. 展开更多
关键词 SYMMETRIC TERNARY LOGIC current-mode cmos circuits THEORY of transmission current-switches Switch-signal THEORY
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SIMPLIFICATION OF CURRENT-MODE MULTIVALUED CMOS CIRCUITS
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作者 汪文君 Claudio Moraga 陈偕雄 《Journal of Electronics(China)》 1995年第3期284-288,共5页
This paper proposes a simplification method for realization of current-mode multivalued CMOS circuits. The key of this method is to find a cover on the K-map for a given multivalued function, which fits to the realiza... This paper proposes a simplification method for realization of current-mode multivalued CMOS circuits. The key of this method is to find a cover on the K-map for a given multivalued function, which fits to the realization of current-mode CMOS circuits. The design example shows that the design presented in this paper is better than the design proposed by G. W. Dueck et al. (1987). 展开更多
关键词 cmos circuit Multivalued LOGIC Four-valued circuit
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Study on Si-SiGe Three-Dimensional CMOS Integrated Circuits 被引量:2
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作者 胡辉勇 张鹤鸣 +2 位作者 贾新章 戴显英 宣荣喜 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第5期681-685,共5页
Based on the physical characteristics of SiGe material,a new three-dimensional (3D) CMOS IC structure is proposed,in which the first device layer is made of Si material for nMOS devices and the second device layer i... Based on the physical characteristics of SiGe material,a new three-dimensional (3D) CMOS IC structure is proposed,in which the first device layer is made of Si material for nMOS devices and the second device layer is made of Six Ge1- x material for pMOS. The intrinsic performance of ICs with the new structure is then limited by Si nMOS.The electrical characteristics of a Si-SiGe 3D CMOS device and inverter are all simulated and analyzed by MEDICI. The simulation results indicate that the Si-SiGe 3D CMOS ICs are faster than the Si-Si 3D CMOS ICs. The delay time of the 3D Si-SiGe CMOS inverter is 2-3ps,which is shorter than that of the 3D Si-Si CMOS inverter. 展开更多
关键词 SI-SIGE THREE-DIMENSIONAL cmos integrated circuits
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A Slice Analysis-Based Bayesian Inference Dynamic Power Model for CMOS Combinational Circuits
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作者 陈杰 佟冬 +2 位作者 李险峰 谢劲松 程旭 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第3期502-509,共8页
To improve the accuracy and speed in cycle-accurate power estimation, this paper uses multiple dimensional coefficients to build a Bayesian inference dynamic power model. By analyzing the power distribution and intern... To improve the accuracy and speed in cycle-accurate power estimation, this paper uses multiple dimensional coefficients to build a Bayesian inference dynamic power model. By analyzing the power distribution and internal node state, we find the deficiency of only using port information. Then, we define the gate level number computing method and the concept of slice, and propose using slice analysis to distill switching density as coefficients in a special circuit stage and participate in Bayesian inference with port information. Experiments show that this method can reduce the power-per-cycle estimation error by 21.9% and the root mean square error by 25.0% compared with the original model, and maintain a 700 + speedup compared with the existing gate-level power analysis technique. 展开更多
关键词 slice analysis Bayesian inference power model cmos combinational circuit
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基于Cadence平台的CMOS人工突触电路教学方法
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作者 李晟 上官剑鸿 +3 位作者 周小双 周婷 殷嘉蔓 姜赛 《高师理科学刊》 2025年第2期88-94,共7页
目前,人工智能(AI)芯片在集成电路(IC)领域发展迅猛,但针对此类新型芯片的传统课堂教学方式对集成电路专业的本科教学存在理论抽象、教学难度大、软件操作复杂和产教脱离等问题.结合培养大纲和行业需求,提出一种基于人工突触芯片设计的... 目前,人工智能(AI)芯片在集成电路(IC)领域发展迅猛,但针对此类新型芯片的传统课堂教学方式对集成电路专业的本科教学存在理论抽象、教学难度大、软件操作复杂和产教脱离等问题.结合培养大纲和行业需求,提出一种基于人工突触芯片设计的集成电路新型教学方法.以CMOS人工突触电路为例,其作为一种新型神经计算单元,被认作未来AI芯片设计的基础单元重要方向.相较传统CMOS计算单元,在应对大数据处理时,能体现出明显的算力和能耗优势.引入业内先进CMOS人工突触电路设计方法,借助产业界常用的Cadence Virtuoso集成电路仿真工具实现课堂教学创新,帮助学生建立集成电路设计理论与实践的紧密联系,实现了卓越教学成果,是一种有效的教学方法. 展开更多
关键词 人工突触 cmos AI集成电路 Cadence Virtuoso
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Total ionizing dose effect modeling method for CMOS digital-integrated circuit
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作者 Bo Liang Jin-Hui Liu +3 位作者 Xiao-Peng Zhang Gang Liu Wen-Dan Tan Xin-Dan Zhang 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2024年第2期32-46,共15页
Simulating the total ionizing dose(TID)of an electrical system using transistor-level models can be difficult and expensive,particularly for digital-integrated circuits(ICs).In this study,a method for modeling TID eff... Simulating the total ionizing dose(TID)of an electrical system using transistor-level models can be difficult and expensive,particularly for digital-integrated circuits(ICs).In this study,a method for modeling TID effects in complementary metaloxide semiconductor(CMOS)digital ICs based on the input/output buffer information specification(IBIS)was proposed.The digital IC was first divided into three parts based on its internal structure:the input buffer,output buffer,and functional area.Each of these three parts was separately modeled.Using the IBIS model,the transistor V-I characteristic curves of the buffers were processed,and the physical parameters were extracted and modeled using VHDL-AMS.In the functional area,logic functions were modeled in VHDL according to the data sheet.A golden digital IC model was developed by combining the input buffer,output buffer,and functional area models.Furthermore,the golden ratio was reconstructed based on TID experimental data,enabling the assessment of TID effects on the threshold voltage,carrier mobility,and time series of the digital IC.TID experiments were conducted using a CMOS non-inverting multiplexer,NC7SZ157,and the results were compared with the simulation results,which showed that the relative errors were less than 2%at each dose point.This confirms the practicality and accuracy of the proposed modeling method.The TID effect model for digital ICs developed using this modeling technique includes both the logical function of the IC and changes in electrical properties and functional degradation impacted by TID,which has potential applications in the design of radiation-hardening tolerance in digital ICs. 展开更多
关键词 cmos digital-integrated circuit Total ionizing dose IBIS model Behavior-physical hybrid model Physical parameters
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Bias Current Compensation Method with 41.4% Standard Deviation Reduction to MOSFET Transconductance in CMOS Circuits
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作者 冒小建 杨华中 汪蕙 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第5期783-786,共4页
A simple and successful method for the stability enhancement of integrated circuits is presented. When the process parameters, temperature, and supply voltage are changed, according to the simulation results, this met... A simple and successful method for the stability enhancement of integrated circuits is presented. When the process parameters, temperature, and supply voltage are changed, according to the simulation results, this method yields a standard deviation of the transconductance of MOSFETs that is 41.4% less than in the uncompensated case. This method can be used in CMOS LC oscillator design. 展开更多
关键词 cmos TRANSCONDUCTANCE integrated circuits TRANSISTOR
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New Design Methodologies for High Speed Low-Voltage 1-Bit CMOS Full Adder Circuits 被引量:1
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作者 Subodh Wairya Rajendra Kumar Nagaria Sudarshan Tiwari 《Computer Technology and Application》 2011年第3期190-198,共9页
New methodologies for l-Bit XOR-XNOR full- adder circuits are proposed to improve the speed and power as these circuits are basic building blocks for ALU circuit implementation. This paper presents comparative study o... New methodologies for l-Bit XOR-XNOR full- adder circuits are proposed to improve the speed and power as these circuits are basic building blocks for ALU circuit implementation. This paper presents comparative study of high-speed, low-power and low voltage full adder circuits. Simulation results illustrate the superiority of the proposed adder circuit against the conventional complementary metal-oxide-semiconductor (CMOS), complementary pass-transistor logic (CPL), TG, and Hybrid adder circuits in terms of delay, power and power delay product (PDP). Simulation results reveal that the proposed circuit exhibits lower PDP and is more power efficient and faster when compared with the best available 1-bit full adder circuits. The design is implemented on UMC 0.18 μm process models in Cadence Virtuoso Schematic Composer at 1.8 V single ended supply voltage and simulations are carried out on Spectre S. 展开更多
关键词 Full adder circuits complementary pass-transistor logic (CPL) complementary cmos high-speed circuits hybrid fulladder XOR-XNOR gate.
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TRANSIENT CHARACTERISTIC ANALYSIS OF HIGH TEMPERATURE CMOS DIGITAL INTEGRATED CIRCUITS
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作者 柯导明 冯耀兰 +1 位作者 童勤义 柯晓黎 《Journal of Electronics(China)》 1994年第2期104-115,共12页
This paper analyses the transient characteristics of high temperature CMOS inverters and gate circuits, and gives the computational formulas of their rise time, fall time and delay time. It may be concluded that the t... This paper analyses the transient characteristics of high temperature CMOS inverters and gate circuits, and gives the computational formulas of their rise time, fall time and delay time. It may be concluded that the transient characteristics of CMOS inverters and gate circuits deteriorate due to the reduction of carrier mobilities and threshold voltages of MOS transistors and the increase of leakage currents of MOS transistors drain terminal pn junctions. The calculation results can explain the experimental phenomenon. 展开更多
关键词 cmos DIGITAL integrated circuits TRANSIENT characteristics High TEMPERATURE cmos
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SYNTHESIS OF MULTIVALUED CMOS CIRCUITS WITH MANY VARIABLES BASED ON TRANSMISSION FUNCTION THEORY
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作者 陈偕雄 赵小杰 吴训威 《Journal of Electronics(China)》 1992年第1期9-16,共8页
Based on transmission function theory,the synthesis technique for multivaluedCMOS circuits is discussed.By comparing the CMOS circuits based on transmission functiontheory with the T gate,it is shown that their action... Based on transmission function theory,the synthesis technique for multivaluedCMOS circuits is discussed.By comparing the CMOS circuits based on transmission functiontheory with the T gate,it is shown that their action principles are identical.Based on it,thesynthesis method for multivalued CMOS circuits with many variables by using function decom-position is proposed. 展开更多
关键词 TRANSMISSION FUNCTION theory Multivalued LOGIC Multivalued cmos circuits
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Development of 0.50μm CMOS Integrated Circuits Technology
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作者 Yu Shan, Zhang Dingkang and Huang Chang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 1992年第4期7-10,2,共5页
Submicron CMOS IC technology, including triple layer resist lithography technology, RIE, LDD, Titanium Salicide, shallow junction, thin gate oxide, no bird's beak isolation and channel's multiple implantation ... Submicron CMOS IC technology, including triple layer resist lithography technology, RIE, LDD, Titanium Salicide, shallow junction, thin gate oxide, no bird's beak isolation and channel's multiple implantation doping technology have been developed. 0.50μm. CMOS integrated circuits have been fabricated using this submicron CMOS process. 展开更多
关键词 In m cmos Integrated circuits Technology Development of 0.50 cmos
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Timing-Driven Variation-Aware Partitioning and Optimization of Mixed Static-Dynamic CMOS Circuits
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作者 Kumar Yelamarthi 《Circuits and Systems》 2013年第2期202-208,共7页
The advancement in CMOS technology has surpassed the progress in computer aided design tools, creating an avenue for new design optimization flows. This paper presents a design level transistor sizing based timing opt... The advancement in CMOS technology has surpassed the progress in computer aided design tools, creating an avenue for new design optimization flows. This paper presents a design level transistor sizing based timing optimization algorithms for mixed-static-dynamic CMOS logic designs. This optimization algorithm performs timing optimization through partitioning a design into static and dynamic circuits based on timing critical paths, and is further extended through a process variation aware circuit level timing optimization algorithm for dynamic CMOS circuits. Implemented on a 64-b adder and ISCAS benchmark circuits for mixed-static-dynamic CMOS, the design level optimization algorithm demonstrated a critical path delay improvement of over 52% in comparison with static CMOS implementation by state-of-the-art commercial optimization tools. 展开更多
关键词 TIMING Optimization Dynamic cmos circuits Process VARIATIONS DELAY Uncertainty
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Development of Physical Library for Short Channel CMOS / SOI Integrated Circuits
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作者 Zhang Xing, Lu Quan, Shi Yongguan, Yang Yinghua, Huang Chang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 1992年第4期16-18,2-6,共5页
An 'Integrated Device and Circuit simulator' for thin film (0.05-0.2μm) submicron (0.5μm) and deep submicron (0.15, 0.25,0.35μm) CMOS/ SOI integrated circuit has been developed. This simulator has been used... An 'Integrated Device and Circuit simulator' for thin film (0.05-0.2μm) submicron (0.5μm) and deep submicron (0.15, 0.25,0.35μm) CMOS/ SOI integrated circuit has been developed. This simulator has been used for design and fabrication and physical library development of thin film submicron and deep submicron CMOS/ SOI integrated circuit. 展开更多
关键词 Development of Physical Library for Short Channel cmos In SOI Integrated circuits
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Logic Picture-Based Dynamic Power Estimation for Unit Gate-Delay Model CMOS Circuits
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作者 Omnia S. Ahmed Mohamed F. Abu-Elyazeed +2 位作者 Mohamed B. Abdelhalim Hassanein H. Amer Ahmed H. Madian 《Circuits and Systems》 2013年第3期276-279,共4页
In this research, a fast methodology to calculate the exact value of the average dynamic power consumption for CMOS combinational logic circuits is developed. The delay model used is the unit-delay model where all gat... In this research, a fast methodology to calculate the exact value of the average dynamic power consumption for CMOS combinational logic circuits is developed. The delay model used is the unit-delay model where all gates have the same propagation delay. The main advantages of this method over other techniques are its accuracy, as it is deterministic and it requires less computational effort compared to exhaustive simulation approaches. The methodology uses the Logic Pictures concept for obtaining the nodes’ toggle rates. The proposed method is applied to well-known circuits and the results are compared to exhaustive simulation and Monte Carlosimulation methods. 展开更多
关键词 Dynamic Power ESTIMATION LOGIC PICTURES cmos Digital LOGIC circuits TOGGLE Rate Unit-Delay Model
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高速数字化三维集成式CCD-CMOS图像传感器
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作者 李明 黄芳 +3 位作者 刘戈扬 周后荣 王小东 任思伟 《半导体光电》 CAS 北大核心 2024年第3期388-394,共7页
为了解决CCD与CMOS工艺兼容性低、互连集成制作难度大,以及芯片间接口匹配和高性能兼备等问题,对CCD器件拓扑结构与像元、CMOS读出电路、三维异质互连集成及高密度引脚封装等技术进行研究,提出了一种1024×256阵列规模的集成式CCD-C... 为了解决CCD与CMOS工艺兼容性低、互连集成制作难度大,以及芯片间接口匹配和高性能兼备等问题,对CCD器件拓扑结构与像元、CMOS读出电路、三维异质互连集成及高密度引脚封装等技术进行研究,提出了一种1024×256阵列规模的集成式CCD-CMOS图像传感器。该器件实现了CCD信号的高精度数字化处理、高速输出及多芯粒的技术融合,填补了国内CCDCMOS三维集成技术空白。测试结果表明:集成CCD-CMOS器件的光响应和成像功能正常,双边成像效果良好,图像无黑条和坏列,互连连通率(99.9%)满足三维集成要求,实现了集成式探测器件的大满阱高灵敏度成像(满阱电子数达165.28ke^(-)、峰值量子效率达86.1%)、高精度数字化(12bit)和高速输出(行频率达100.85kHz),满足集成化、数字化、小型化的多光谱探测成像系统要求。 展开更多
关键词 集成式CCD-cmos探测器 三维互连集成 电荷耦合器件 cmos读出电路
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星敏感器CMOS电路板靶面自动装调系统
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作者 任同群 曹润嘏 +4 位作者 张国锐 石权 崔璨 孔帅 王晓东 《光学精密工程》 EI CAS CSCD 北大核心 2024年第16期2513-2522,共10页
CMOS电路板靶面是星敏感器结构中的关键部分,其安装姿态影响离焦距离的准确性,进而影响星敏感器成像性能。因此,靶面的装调是确保星敏感器成像质量的重要环节。当前,靶面装调主要依靠人工装调完成,存在装调精度低、产品一致性差、周期... CMOS电路板靶面是星敏感器结构中的关键部分,其安装姿态影响离焦距离的准确性,进而影响星敏感器成像性能。因此,靶面的装调是确保星敏感器成像质量的重要环节。当前,靶面装调主要依靠人工装调完成,存在装调精度低、产品一致性差、周期长等问题,导致产品的良品率较低。为此,研制了一台星敏感器CMOS电路板靶面自动装调设备。采取非接触式测量方式,集成测量模组与微动平台完成CMOS靶面与基准面的相对位姿测量,解决由星敏感器特殊结构造成的狭小空间内高精度测量难题。设计调整机构实现零件任意角度翻转,消除测量方向与装配方向不一致造成系统结构布置复杂的影响。最后,对测量系统进行精度分析,采用局部枚举法开发了调整垫片研磨量算法,解决由平面姿态单一已知量反求多垫片研磨量的欠定问题。实验结果表明:该系统可实现靶面自动装调功能,测量系统的重复性为1.6′,满足技术指标要求。 展开更多
关键词 星敏感器 cmos电路板靶面 自动化装调 精度分析
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超快四分幅CMOS电路设计与仿真
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作者 蔡厚智 黄晓雅 +4 位作者 杨恺知 马友麟 解朝阳 刘进元 向利娟 《强激光与粒子束》 CAS CSCD 北大核心 2024年第12期29-35,共7页
用于惯性约束聚变诊断的传统微通道板(microchannel plate,MCP)选通分幅相机存在体积大、非单视线成像等问题,可用时间分辨率为百皮秒的CMOS芯片代替MCP变像管,将分幅相机芯片化并实现单视线成像。提出了具有8×8×4像素阵列的... 用于惯性约束聚变诊断的传统微通道板(microchannel plate,MCP)选通分幅相机存在体积大、非单视线成像等问题,可用时间分辨率为百皮秒的CMOS芯片代替MCP变像管,将分幅相机芯片化并实现单视线成像。提出了具有8×8×4像素阵列的单视线四分幅超快成像CMOS电路,并对其性能进行了模拟仿真。基于0.18μm标准CMOS工艺、5晶体管(5T)像素单元结构,设计了四分幅像素单元电路、电压控制延迟器、时钟树以及行列选通电路等。对CMOS电路像素信号进行选通输出并分析,仿真结果表明该CMOS电路可实现单次四分幅成像,每幅图像的时间分辨率为100 ps,相邻两幅图像之间的时间间隔为300 ps,四幅图像像素信号均匀性优于90%。 展开更多
关键词 cmos电路 惯性约束聚变 超快诊断 分幅成像
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用于射频能量收集的低阈值CMOS整流电路设计
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作者 徐雷钧 孙鑫 +1 位作者 白雪 陈建锋 《半导体技术》 CAS 北大核心 2024年第4期365-372,共8页
基于TSMC 180 nm工艺,设计了一款高效率低阈值整流电路。在传统差分输入交叉耦合整流电路的基础上,提出源极与衬底之间增加双PMOS对称辅助晶体管配合缓冲电容的改进结构,对整流晶体管进行阈值补偿。有效缓解了MOS管的衬底偏置效应,降低... 基于TSMC 180 nm工艺,设计了一款高效率低阈值整流电路。在传统差分输入交叉耦合整流电路的基础上,提出源极与衬底之间增加双PMOS对称辅助晶体管配合缓冲电容的改进结构,对整流晶体管进行阈值补偿。有效缓解了MOS管的衬底偏置效应,降低了整流电路的开启阈值电压,针对较低输入信号功率,提高了整流电路的功率转换效率(PCE)。同时将低阈值整流电路三级级联以提高输出电压。测试结果显示,在输入信号功率为-14 dBm@915 MHz时,三级级联低阈值整流电路实现了升压功能,能稳定输出1.2 V电压,峰值PCE约为71.32%。相较于传统结构,该低阈值整流电路更适合用于射频能量收集。 展开更多
关键词 互补金属氧化物半导体(cmos) 射频能量收集 低阈值电压 RF-DC整流电路 差分输入交叉耦合整流电路
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CMOS图像传感器辐射敏感参数测试电路设计及试验验证
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作者 王祖军 聂栩 +4 位作者 唐宁 王兴鸿 尹利元 晏石兴 李传洲 《半导体光电》 CAS 北大核心 2024年第2期216-221,共6页
以航天领域广泛应用的CMV4000型CMOS图像传感器(CIS)为研究对象,通过开展CIS辐射敏感参数测试电路设计,将CIS辐照电路板与测试电路板中FPGA数据采集及传输板分离,辐照电路板与测试电路板通过接插口通信,从而实现开展辐照试验时对FPGA数... 以航天领域广泛应用的CMV4000型CMOS图像传感器(CIS)为研究对象,通过开展CIS辐射敏感参数测试电路设计,将CIS辐照电路板与测试电路板中FPGA数据采集及传输板分离,辐照电路板与测试电路板通过接插口通信,从而实现开展辐照试验时对FPGA数据采集部分进行辐射屏蔽防护,避免FPGA数据采集板受到辐射影响。开展了CIS测试电路中的电源模块、数据采集、存储模块、外围电路等设计及PCB版图的布局布线设计。采用VerilogHDL硬件描述语言对各个功能模块进行驱动时序设计,实现CIS辐射敏感参数测试功能。通过开展CMV4000型CIS ^(60)Coγ射线辐照试验,分析了平均暗信号、暗信号非均匀性、暗信号分布等辐射敏感参数随总剂量增大的退化规律,验证了CIS辐射敏感参数测试系统的可靠性。 展开更多
关键词 cmos图像传感器 测试电路设计 辐照试验 辐照损伤效应 辐射敏感参数
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