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The structure-based multi-fault test generation algorithm for combinational circuit
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作者 商庆华 吴丽华 项傅佳 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2006年第4期452-454,共3页
In this paper the structure-based test generation algorithm has been studied for the problem that test patterns are obtained by determined finite faults set in the past. This Algorithm can find out all test patterns o... In this paper the structure-based test generation algorithm has been studied for the problem that test patterns are obtained by determined finite faults set in the past. This Algorithm can find out all test patterns one tithe, so faults detection is very convenient. By simulation, the smallest test patterns set can be obtained and faults coverage rate is 100%. 展开更多
关键词 combinational circuit test generation the smallest test patterns set
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